In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages
(2017)
Journal Article
Eleffendi, M. A., & Johnson, C. M. (2017). In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages. IEEE Transactions on Power Electronics, 32(9), 7187-7198. https://doi.org/10.1109/TPEL.2016.2628705
Wire-bond lift-off and Solder fatigue are degradation mechanisms that dominate the lifetime of power semiconductor packages. Although their lifetime is commonly estimated at the design stage, based on mission profiles and Physics-of-Failure models, t... Read More about In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages.