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All Outputs (196)

Methodology for the development of in-line optical surface measuring instruments with a case study for additive surface finishing (2019)
Journal Article

The productivity rate of a manufacturing process is limited by the speed of any measurement processes at the quality control stage. Fast and effective in-line measurements are required to overcome this limitation. Optical instruments are the most pro... Read More about Methodology for the development of in-line optical surface measuring instruments with a case study for additive surface finishing.

Assessment of surface topography modifications through feature-based registration of areal topography data (2019)
Journal Article

Surface topography modifications due to wear or other factors are usually investigated by visual and microscopic inspection, and – when quantitative assessment is required – through the computation of surface texture parameters. However, the current... Read More about Assessment of surface topography modifications through feature-based registration of areal topography data.

Imaging beyond the fundamental slope limit in surface metrology using fluorophore-aided scattering microscopy (2018)
Presentation / Conference

Topography measurement for smooth surfaces with high slopes, e.g. freeform optics, is a challenging task for optical measuring instruments as the light reflected by the tilted surface cannot be sufficiently collected by the objective, resulting in lo... Read More about Imaging beyond the fundamental slope limit in surface metrology using fluorophore-aided scattering microscopy.