M. Thomas
Verification of a rigorous 2D model of rough surface scattering
Thomas, M.; Leach, R.K.; Nikolaev, N.; Widjanarko, T.; Senin, N.; Aryan, H.; Coupland, J.M.
Authors
RICHARD LEACH RICHARD.LEACH@NOTTINGHAM.AC.UK
Chair in Metrology
N. Nikolaev
T. Widjanarko
N. Senin
H. Aryan
J.M. Coupland
Abstract
A rigorous two-dimensional (2D) model of electromagnetic surface scatter has been developed, based on a boundary element method (BEM) established by Simonsen [1]. Simulated far-field scatter is compared to that measured from a laser scatterometer for a sinusoidal grating, with a mean difference of 3% of the peak intensity.
Citation
Thomas, M., Leach, R., Nikolaev, N., Widjanarko, T., Senin, N., Aryan, H., & Coupland, J. (2018). Verification of a rigorous 2D model of rough surface scattering.
Conference Name | European Optical Society Biennial Meeting (EOSAM) 2018 |
---|---|
End Date | Oct 12, 2018 |
Acceptance Date | Jun 29, 2018 |
Publication Date | Oct 12, 2018 |
Deposit Date | Jul 20, 2018 |
Publicly Available Date | Oct 12, 2018 |
Peer Reviewed | Peer Reviewed |
Public URL | https://nottingham-repository.worktribe.com/output/950585 |
Files
eosam_2018_extended_abstract_accepted.pdf
(262 Kb)
PDF
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