All Outputs (18)

Comparison of two noise reduction methods in coherence scanning interferometry for surface measurement (2019)
Conference Proceeding

Coherence scanning interferometry (CSI) can measure relatively flat surfaces with sub-nanometre precision, but the measurement noise may increase significantly if the intensity of the interferometric signal reduces when measuring non-flat surfaces or... Read More about Comparison of two noise reduction methods in coherence scanning interferometry for surface measurement.

Development of mathematical reference standards for the validation of surface texture parameter calculation software (2018)
Conference Proceeding

A framework for the validation of surface texture parameter calculation software is proposed. The framework utilises mathematically defined surfaces and mathematically calculated surface texture parameter values to produce a reference against which t... Read More about Development of mathematical reference standards for the validation of surface texture parameter calculation software.

Design of a multi-sensor in-situ inspection system for additive manufacturing (2018)
Conference Proceeding

A programmable software framework for the generation of simulated surface topography (2018)
Conference Proceeding

A flexible and programmable software framework has been developed that enables the creation of simulated, areal surface topography datasets. The framework allows the creation of surfaces through a layered approach where deterministic topographic stru... Read More about A programmable software framework for the generation of simulated surface topography.

Flexible software framework for the generation of simulated surface topography (2018)
Conference Proceeding

Development of an X-ray simulator: from STTL file to grey scale image (2018)
Conference Proceeding

Development of mathematically-defined surfaces (2017)
Conference Proceeding

New software has been developed that enables the creation of areal surface topography representations. The goal of this software package is to utilise the mathematically-defined surface representations in the development of surface texture parameter... Read More about Development of mathematically-defined surfaces.

True-color 3D surface metrology for additive manufacturing using interference microscopy (2017)
Conference Proceeding

Coherence scanning interferometry (CSI) is widely used for surface topography characterisation. With the ability to measure both rough surfaces with the high slopes and optical finishes, CSI has made contibutions in fields from industrial machining t... Read More about True-color 3D surface metrology for additive manufacturing using interference microscopy.

Optimisation of surface topography characterisation for metal additive manufacturing using coherence scanning interferometry (2017)
Conference Proceeding

The surface topography of metal additive manufactured (AM) parts can be challenging to measure due to the presence of complex features, such as high slopes, step like recesses and protuberances, and local variations in reflectance. Recent innovations... Read More about Optimisation of surface topography characterisation for metal additive manufacturing using coherence scanning interferometry.

An analysis of Type F2 software measurement standards for profile surface texture parameters [Abstract] (2017)
Conference Proceeding

Results of an industrial survey on the use of surface texture parameters (2017)
Conference Proceeding

In 1999, CIRP conducted an industrial survey of the use of surface texture parameters [1]. In the seventeen years since, much has changed, with the most important advancement being the introduction of areal surface texture parameters as described in... Read More about Results of an industrial survey on the use of surface texture parameters.

Coherence scanning interferometry for additive manufacture (2017)
Conference Proceeding

Additive manufacture (AM) of metal components is a rapidly maturing technology; but given the large number of interrelated process parameters, it remains difficult to control to high precision. It has been observed that processing conditions may be a... Read More about Coherence scanning interferometry for additive manufacture.

X-ray computed tomography of additively manufactured metal parts: the effect of magnification and reconstruction sampling on surface topography measurement (2017)
Conference Proceeding

X-ray computed tomography (XCT) has recently become recognised as a viable method of surface topography measurement for additively manufactured (AM) metal parts [1–5]. AM is capable of producing internal features that are inaccessible to other surfac... Read More about X-ray computed tomography of additively manufactured metal parts: the effect of magnification and reconstruction sampling on surface topography measurement.

An industrial survey on the use of surface texture parameters (2017)
Conference Proceeding

In 1999, CIRP conducted an industrial survey of the use of surface texture parameters [1]. In the seventeen years since, much has changed, with the most important advancement being the introduction of areal surface texture parameters as described in... Read More about An industrial survey on the use of surface texture parameters.

Measurement of internal surfaces of additively manufactured parts by X-ray computed tomography (2017)
Conference Proceeding

Recent advances in X-ray computed tomography (XCT) have allowed for measurement resolutions approaching the point where XCT can be used for measuring surface topography. These advances make XCT appealing for measuring hard-to-reach or internal surfac... Read More about Measurement of internal surfaces of additively manufactured parts by X-ray computed tomography.

Contamination of µCMM stylus tips: on-machine inspection (2016)
Conference Proceeding

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of a µCMM system. Regular cleaning of the stylus is essential to minimising the dimensional error but little data exists for determining appropri... Read More about Contamination of µCMM stylus tips: on-machine inspection.

The development of a snow cleaning system for micro-CMM stylus tips (2015)
Conference Proceeding

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of the CMM systems, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. To reduce such e... Read More about The development of a snow cleaning system for micro-CMM stylus tips.

Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips (2015)
Conference Proceeding

The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To... Read More about Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips.