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Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips

Feng, Xiaobing; Lawes, Simon; Kinnell, Peter K.


Xiaobing Feng

Peter K. Kinnell


The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To reduce such errors, this study evaluates the suitability of three cleaning methods (brushing, laser cleaning and snow cleaning) for removing surface contamination on a micro-CMM stylus tip. The cleaning capability of each method is experimentally investigated. Due to the fragile nature of the styli, possible damage (mechanical and thermal) to the tip is assessed. Overall, snow cleaning was found to possess higher cleaning capability and lower risk of damage than the other two methods.


Feng, X., Lawes, S., & Kinnell, P. K. (2015). Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips

Conference Name 4M/ICOMM2015 Conference
Acceptance Date Jan 28, 2015
Publication Date Mar 31, 2015
Deposit Date Jun 6, 2016
Peer Reviewed Peer Reviewed
Keywords cleaning capability; micro-CMM stylus tip; mechanical damage; thermal damage
Public URL
Publisher URL
Copyright Statement Copyright information regarding this work can be found at the following address:
Additional Information doi:10.3850/978-981-09-4609-8_126.
Published in: Proceedings of the 4M/ICOMM2015 Conference.
Research Publishing, 2015, ISBN 9789810946449. indicates [papers] may not be reproduced in any form or by any means, electronic or mechanical, including photocopying, recording or any information storage and retrieval system now known or to be invented, without written permission from the 4M/ICOMM2015 Organisers or the Publisher.