Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips
Feng, Xiaobing; Lawes, Simon; Kinnell, Peter K.
SIMON LAWES S.Lawes@nottingham.ac.uk
Peter K. Kinnell
The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To reduce such errors, this study evaluates the suitability of three cleaning methods (brushing, laser cleaning and snow cleaning) for removing surface contamination on a micro-CMM stylus tip. The cleaning capability of each method is experimentally investigated. Due to the fragile nature of the styli, possible damage (mechanical and thermal) to the tip is assessed. Overall, snow cleaning was found to possess higher cleaning capability and lower risk of damage than the other two methods.
Feng, X., Lawes, S., & Kinnell, P. K. (2015). Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips
|Conference Name||4M/ICOMM2015 Conference|
|Acceptance Date||Jan 28, 2015|
|Publication Date||Mar 31, 2015|
|Deposit Date||Jun 6, 2016|
|Peer Reviewed||Peer Reviewed|
|Keywords||cleaning capability; micro-CMM stylus tip; mechanical damage; thermal damage|
|Copyright Statement||Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf|
Published in: Proceedings of the 4M/ICOMM2015 Conference.
Research Publishing, 2015, ISBN 9789810946449.
http://rpsonline.com.sg/proceedings/9789810946098/html/copyright.html indicates [papers] may not be reproduced in any form or by any means, electronic or mechanical, including photocopying, recording or any information storage and retrieval system now known or to be invented, without written permission from the 4M/ICOMM2015 Organisers or the Publisher.
This file is under embargo due to copyright reasons.
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