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True-color 3D surface metrology for additive manufacturing using interference microscopy

DiSciacca, Jack; Gomez, Carlos; Thompson, Adam; Lawes, Simon; Leach, Richard; Colonna de Lega, Xavier; de Groot, Peter

Authors

Jack DiSciacca

Carlos Gomez carlos.gomez@nottingham.ac.uk

Adam Thompson

Simon Lawes

Richard Leach

Xavier Colonna de Lega

Peter de Groot



Abstract

Coherence scanning interferometry (CSI) is widely used for surface topography characterisation. With the ability to measure both rough surfaces with the high slopes and optical finishes, CSI has made contibutions in fields from industrial machining to optical fabrication and polishing [1,2]. While the low coherence sources for CSI are typically broadband and suitable for color imaging, the metrology is usually performed without regards for the color information [3]. We present color surface topography measurements from a CSI instrument designed to provide true color images in addition to areal surface topography of additive manufactired samples. The addition of color measurements enables contamination and defect detection along with blemish and discoloration identification.

Publication Date Oct 10, 2017
Peer Reviewed Peer Reviewed
APA6 Citation DiSciacca, J., Gomez, C., Thompson, A., Lawes, S., Leach, R., Colonna de Lega, X., & de Groot, P. (2017). True-color 3D surface metrology for additive manufacturing using interference microscopy
Copyright Statement Copyright information regarding this work can be found at the following address: http://eprints.nottingh.../end_user_agreement.pdf

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True-color 3D surface metrology for additive manufacturing using interference.pdf (1.5 Mb)
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Copyright Statement
Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf





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