All Outputs (7)

Extracting focus variation data from coherence scanning interferometric measurements (2024)
Journal Article

Coherence scanning interferometry (CSI), based on the principle of interference, can achieve sub-nanometer precision for height measurements. On the other hand, focus variation microscopy (FVM), combining the small depth of field of the objective, is... Read More about Extracting focus variation data from coherence scanning interferometric measurements.

Comparison of Fourier optics-based methods for modeling coherence scanning interferometry (2024)
Journal Article

Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measurement of industrial and biomedical surfaces. The operation of CSI can be modeled using approximate physics-based approaches with minimal computationa... Read More about Comparison of Fourier optics-based methods for modeling coherence scanning interferometry.

Dynamic surface displacement measurement using carrier optical vortex interferometer: A numerical study (2023)
Journal Article

The measurement of dynamic surface displacement is crucial in understanding mechanical and thermophysical dynamics at nanometre to micrometre-scale. Interferometers using optical vortices are gaining attention due to their ability to demodulate fring... Read More about Dynamic surface displacement measurement using carrier optical vortex interferometer: A numerical study.

Comparison of approximate methods for modelling coherence scanning interferometry (2023)
Journal Article

Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measurement of industrial and biomedical surfaces. The operation of CSI can be modelled using approximate physics-based approaches with minimal computation... Read More about Comparison of approximate methods for modelling coherence scanning interferometry.

Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement (2023)
Conference Proceeding

The most common optical technologies for surface topography measurement are coherence scanning interferometry (CSI), focus variation microscopy (FV) and imaging confocal microscopy (CM). Due to the benefits and drawbacks of each, these instruments ar... Read More about Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement.

Quantitative investigation of the validity conditions for the Beckmann-Kirchhoff scattering model (2022)
Journal Article

Approximate and rigorous methods are widely used to model light scattering from a surface. The boundary element method (BEM) is a rigorous model that accounts for polarization and multiple scattering effects. BEM is suitable to model the scattered li... Read More about Quantitative investigation of the validity conditions for the Beckmann-Kirchhoff scattering model.

Quantifying the validity conditions of the Beckmann-Kirchhoff scattering model (2022)
Conference Proceeding

Approximate and rigorous methods are widely used to model light scattering from a surface. The boundary element method (BEM) is a rigorous model that accounts for polarisation and multiple scattering effects. BEM is suitable to model the scattered li... Read More about Quantifying the validity conditions of the Beckmann-Kirchhoff scattering model.