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Comparison of approximate methods for modelling coherence scanning interferometry

Hooshmand, Helia; Pahl, Tobias; de Groot, Peter J.; Lehmann, Peter; Pappas, Athanasios; Su, Rong; Leach, Richard; Piano, Samanta

Authors

Tobias Pahl

Peter J. de Groot

Peter Lehmann

Athanasios Pappas

Rong Su



Abstract

Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measurement of industrial and biomedical surfaces. The operation of CSI can be modelled using approximate physics-based approaches with minimal computational effort. A critical aspect of CSI modelling is defining the transfer function for the imaging properties of the instrument in order to predict the interference fringes from which topography information is extracted. Approximate methods, for example, elementary Fourier optics, universal Fourier optics and foil models, use scalar diffraction theory and the imaging properties of the optical system to model CSI surface topography measurement. In this paper, the measured topographies of different surfaces, including various sinusoids, two posts and a step height, calculated using the three example methods are compared. The presented results illustrate the agreement between the three example models.

Citation

Hooshmand, H., Pahl, T., de Groot, P. J., Lehmann, P., Pappas, A., Su, R., Leach, R., & Piano, S. (2023, June). Comparison of approximate methods for modelling coherence scanning interferometry. Presented at Modeling Aspects in Optical Metrology IX, Munich, Germany

Presentation Conference Type Edited Proceedings
Conference Name Modeling Aspects in Optical Metrology IX
Start Date Jun 26, 2023
End Date Jun 28, 2023
Acceptance Date Aug 10, 2023
Online Publication Date Aug 10, 2023
Publication Date Aug 10, 2023
Deposit Date Aug 14, 2023
Publisher Society of Photo-optical Instrumentation Engineers
Peer Reviewed Peer Reviewed
Volume 12619
Article Number 126190R
Series Title SPIE - International Society for Optical Engineering. Proceedings
Series ISSN 1996-756X
Book Title Modeling Aspects in Optical Metrology IX
ISBN 9781510664470
DOI https://doi.org/10.1117/12.2673657
Keywords 3D modeling; Equipment; Modeling; Optical surfaces; Instrument modeling; Light sources and illumination; Fourier transforms; Imaging systems; Interferometry
Public URL https://nottingham-repository.worktribe.com/output/24344497
Publisher URL https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12619/2673657/Comparison-of-approximate-methods-for-modelling-coherence-scanning-interferometry/10.1117/12.2673657.short?SSO=1