Sub-100 nm resolution microscopy based on proximity projection grating scheme
(2015)
Journal Article
Hu, F., Somekh, M. G., Albutt, D. J., Webb, K., Moradi, E., & See, C. W. (2015). Sub-100 nm resolution microscopy based on proximity projection grating scheme. Scientific Reports, 5, https://doi.org/10.1038/srep08589
Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured il... Read More about Sub-100 nm resolution microscopy based on proximity projection grating scheme.