Sub-100 nm resolution microscopy based on proximity projection grating scheme

Hu, Feng; Somekh, Michael G.; Albutt, Darren J.; Webb, Kevin; Moradi, Emilia; See, Chung W.

Abstract

Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.

Citation

Hu, F., Somekh, M. G., Albutt, D. J., Webb, K., Moradi, E., & See, C. W. (2015). Sub-100 nm resolution microscopy based on proximity projection grating scheme. Scientific Reports, 5, https://doi.org/10.1038/srep08589

• Journal Article Type: Article
• Acceptance Date: Jan 26, 2015
• Online Publication Date: Feb 26, 2015
• Publication Date: Jan 1, 2015
• Deposit Date: Oct 22, 2020
• Publicly Available Date: Oct 22, 2020
• Journal: Scientific Reports
• Print ISSN: 2045-2322
• Electronic ISSN: 2045-2322
• Publisher: Nature Publishing Group
• Peer Reviewed: Peer Reviewed
• Volume: 5
• Article Number: 8589
• DOI: https://doi.org/10.1038/srep08589
• Public URL: https://nottingham-repository.worktribe.com/output/4831729
• Publisher URL: https://www.nature.com/articles/srep08589