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Making the practically impossible "Merely difficult": cryogenic FIB lift-out for "Damage Free" soft matter imaging (2016)
Journal Article

The preparation of thinned lamellae from bulk samples for transmission electron microscopy (TEM) analysis has been possible in the focussed ion beam scanning electron microscope (FIB?SEM) for over 20 years via the in situ lift?out method. Lift?out of... Read More about Making the practically impossible "Merely difficult": cryogenic FIB lift-out for "Damage Free" soft matter imaging.