Making the practically impossible "Merely difficult": cryogenic FIB lift-out for "Damage Free" soft matter imaging

Parmenter, Christopher; Fay, Michael; Hartfield, Cheryl; Eltaher, Hoda

Abstract

The preparation of thinned lamellae from bulk samples for transmission electron microscopy (TEM) analysis has been possible in the focussed ion beam scanning electron microscope (FIB‐SEM) for over 20 years via the in situ lift‐out method. Lift‐out offers a fast and site specific preparation method for TEM analysis, typically in the field of materials science. More recently it has been applied to a low‐water content biological sample (Rubino 2012). This work presents the successful lift‐out of high‐water content lamellae, under cryogenic conditions (cryo‐FIB lift‐out) and using a nanomanipulator retaining its full range of motion, which are advances on the work previously done by Rubino (2012). Strategies are explored for maintaining cryogenic conditions, grid attachment using cryo‐condensation of water and protection of the lamella when transferring to the TEM.

Citation

Parmenter, C., Fay, M., Hartfield, C., & Eltaher, H. (2016). Making the practically impossible "Merely difficult": cryogenic FIB lift-out for "Damage Free" soft matter imaging. Microscopy Research and Technique, 79(4), 298 - 303. https://doi.org/10.1002/jemt.22630

• Journal Article Type: Article
• Acceptance Date: Jan 8, 2016
• Online Publication Date: Feb 15, 2016
• Publication Date: Apr 1, 2016
• Deposit Date: Aug 9, 2018
• Print ISSN: 1059-910X
• Electronic ISSN: 1097-0029
• Publisher: Wiley
• Peer Reviewed: Peer Reviewed
• Volume: 79
• Issue: 4
• Pages: 298 - 303
• DOI: https://doi.org/10.1002/jemt.22630
• Public URL: https://nottingham-repository.worktribe.com/output/1111345
• Publisher URL: https://onlinelibrary.wiley.com/doi/full/10.1002/jemt.22630
• PMID: 00037291