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γ-rays irradiation effects on dielectric properties of Ti/Au/GaAsN Schottky diodes with 1.2%N

Teffahi, A.; Hamri, D.; Djeghlouf, A.; Abboun Abid, M.; Saidane, A.; Al Saqri, N.; Felix, J.F.; henini, m

Authors

A. Teffahi

D. Hamri

A. Djeghlouf

M. Abboun Abid

A. Saidane

N. Al Saqri

J.F. Felix



Abstract

Dielectric properties of As grown and irradiated Ti /Au/GaAsN Schottky diodes with 1.2%N are investigated using capacitance/conductance-voltage measurements in 90–290 K temperature range and 50–2000 kHz frequency range. Extracted parameters are interface state density, series resistance, dielectric constant, dielectric loss, tangent loss and ac conductivity. It is shown that exposure to γ-rays irradiation leads to reduction in effective trap density believed to result from radiation-induced traps annulations. An increase in series resistance is attributed to a net doping reduction. Dielectric constant (ε’) shows usual step-like transitions with corresponding relaxation peaks in dielectric loss. These peaks shift towards lower temperature as frequency decrease. Temperature dependant ac conductivity followed an Arrhenius relation with activation energy of 153 meV in the 200–290 K temperature range witch correspond to As vacancy. The results indicate that γ-rays irradiation improves the dielectric and electrical properties of the diode due to the defect annealing effect.

Journal Article Type Article
Publication Date Jun 30, 2018
Journal Radiation Physics and Chemistry
Print ISSN 0969-806X
Electronic ISSN 0969-806X
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 147
APA6 Citation Teffahi, A., Hamri, D., Djeghlouf, A., Abboun Abid, M., Saidane, A., Al Saqri, N., …henini, M. (2018). γ-rays irradiation effects on dielectric properties of Ti/Au/GaAsN Schottky diodes with 1.2%N. Radiation Physics and Chemistry, 147, https://doi.org/10.1016/j.radphyschem.2018.01.029
DOI https://doi.org/10.1016/j.radphyschem.2018.01.029
Keywords γ-Rays irradiation, Dielectric relaxation, Dielectric constant, Dielectric loss, AC conductivity
Publisher URL https://www.sciencedirect.com/science/article/pii/S0969806X17309301
Copyright Statement Copyright information regarding this work can be found at the following address: http://eprints.nottingh.../end_user_agreement.pdf

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Copyright Statement
Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf





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