Elyes Garoudja
Machine learning-based method for predicting C–V-T characteristics and electrical parameters of GaAs/AlGaAs multi-quantum wells Schottky diodes
Garoudja, Elyes; Baouta, Assia; Derbal, Abdeladhim; Filali, Walid; Oussalah, Slimane; Khelladi, Meriem; Lekoui, Fouaz; Amrani, Rachid; Sengouga, Nouredine; Henini, Mohamed
Authors
Assia Baouta
Abdeladhim Derbal
Walid Filali
Slimane Oussalah
Meriem Khelladi
Fouaz Lekoui
Rachid Amrani
Nouredine Sengouga
Professor MOHAMED HENINI MOHAMED.HENINI@NOTTINGHAM.AC.UK
Professor of Applied Physics
Abstract
In this work, two models of artificial neural networks are developed to predict the electrical parameters and capacitance-voltage characteristics of GaAs/AlGaAs multi-quantum wells Schottky diodes at different temperatures. Capacitance-Voltage-Temperature (C–V-T) characteristics for voltages and temperatures in the ranges (-4 V–0 V) and (20 K–400 K), respectively, were used to assess the effectiveness of the proposed approach. The first model (Model 1) is used to evaluate how well the neural network predicts the C–V-T characteristics. The second simulation, known as Model 2, was constructed to simultaneously overcome the problems of determining the electrical parameters and predicting C–V-T characteristics. Model 2 allows the calculation of the built-in voltage, effective density, and capacitance. Three-fold cross-validation and mean square error are used to assess the effectiveness of the developed models. The results clearly demonstrate the high prediction accuracy of the electrical parameters and C–V characteristics at all temperatures. After training, Model 1 Mean Square Error performance is 1.5033×10−6 at 1450 epochs, whereas Model 2 MSE is 4.9951×10−6 at 642 epochs. According to the error distribution frequency histogram, about 95 % of errors for Model 1 and Model 2 lie between [0.00535 and 0.005608] and [0.00328 and 0.00333], respectively. The R-values that correspond to the training and validation datasets for both models are close to one (0.9999). Parameters determination results have been compared against those obtained using ant lion optimizer based method. It was found that the results obtained from the neural networks models strongly agree with the experimental data.
Citation
Garoudja, E., Baouta, A., Derbal, A., Filali, W., Oussalah, S., Khelladi, M., Lekoui, F., Amrani, R., Sengouga, N., & Henini, M. (2024). Machine learning-based method for predicting C–V-T characteristics and electrical parameters of GaAs/AlGaAs multi-quantum wells Schottky diodes. Physica B: Condensed Matter, 685, Article 415998. https://doi.org/10.1016/j.physb.2024.415998
Journal Article Type | Article |
---|---|
Acceptance Date | Apr 19, 2024 |
Online Publication Date | Apr 21, 2024 |
Publication Date | Jul 15, 2024 |
Deposit Date | Apr 25, 2024 |
Publicly Available Date | Apr 22, 2025 |
Journal | Physica B: Condensed Matter |
Print ISSN | 0921-4526 |
Electronic ISSN | 1873-2135 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 685 |
Article Number | 415998 |
DOI | https://doi.org/10.1016/j.physb.2024.415998 |
Keywords | Ant lion optimizer; Multi-quantum wells; Schottky barrier diode; Capacitance-voltage characteristic; Artificial neural network; K-fold cross-validation |
Public URL | https://nottingham-repository.worktribe.com/output/34104094 |
Publisher URL | https://www.sciencedirect.com/science/article/abs/pii/S0921452624003399?via%3Dihub |
Files
This file is under embargo until Apr 22, 2025 due to copyright restrictions.
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