Gabriele Gradoni
Near-field scanning and propagation of correlated low-frequency radiated emissions
Gradoni, Gabriele; Madenoor Ramapriya, Deepthee; Creagh, Stephen C.; Tanner, Gregor; Baharuddin, Mohd Hafiz; Nasser, Hayan; Smartt, Christopher; Thomas, David W.P.
Authors
Deepthee Madenoor Ramapriya
STEPHEN CREAGH STEPHEN.CREAGH@NOTTINGHAM.AC.UK
Associate Professor
GREGOR TANNER GREGOR.TANNER@NOTTINGHAM.AC.UK
Professor of Applied Mathematics
Mohd Hafiz Baharuddin
Hayan Nasser
Christopher Smartt
David W.P. Thomas
Abstract
Electromagnetic radiation from complex printed circuit boards can occur over a broad frequency bandwidth, ranging from hundreds of MHz to tens of GHz. This is becoming a critical issue for assessment of EMC and interoperability as electronic components become more and more integrated. We use emissions from an enclosure with a single-slot aperture and equipped with operating electronics to exemplify and model such sources. Spatial correlation functions obtained from two-probe measurements are used both to characterise the source and to propagate the emissions. We examine emissions in the submicrowave frequency range, where evanescent decay dominates the measured correlation function at the distances measured. We find that an approximate, diffusion-like propagator describes the measured emissions well. A phase-space approach based on Wigner functions is exploited to develop this approximation and to provide enhanced understanding of the emissions.
Citation
Gradoni, G., Madenoor Ramapriya, D., Creagh, S. C., Tanner, G., Baharuddin, M. H., Nasser, H., …Thomas, D. W. (2017). Near-field scanning and propagation of correlated low-frequency radiated emissions. IEEE Transactions on Electromagnetic Compatibility, 60(6), 2045-2048. https://doi.org/10.1109/TEMC.2017.2778046
Journal Article Type | Article |
---|---|
Acceptance Date | Oct 9, 2017 |
Publication Date | Dec 20, 2017 |
Deposit Date | Jan 19, 2018 |
Publicly Available Date | Jan 19, 2018 |
Journal | IEEE Transactions on Electromagnetic Compatibility |
Print ISSN | 0018-9375 |
Electronic ISSN | 1558-187X |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 60 |
Issue | 6 |
Pages | 2045-2048 |
DOI | https://doi.org/10.1109/TEMC.2017.2778046 |
Keywords | Correlation, near-field scan, radiated emissions, statistical electromagnetics, Wigner function |
Public URL | https://nottingham-repository.worktribe.com/output/900961 |
Publisher URL | http://ieeexplore.ieee.org/document/8231199/ |
Additional Information | (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
Contract Date | Jan 19, 2018 |
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