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Near-field scanning and propagation of correlated low-frequency radiated emissions

Gradoni, Gabriele; Madenoor Ramapriya, Deepthee; Creagh, Stephen C.; Tanner, Gregor; Baharuddin, Mohd Hafiz; Nasser, Hayan; Smartt, Christopher; Thomas, David W.P.

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Gabriele Gradoni

Deepthee Madenoor Ramapriya

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Professor of Applied Mathematics

Mohd Hafiz Baharuddin

Hayan Nasser

Professor of Electromagnetics Applications


Electromagnetic radiation from complex printed circuit boards can occur over a broad frequency bandwidth, ranging from hundreds of MHz to tens of GHz. This is becoming a critical issue for assessment of EMC and interoperability as electronic components become more and more integrated. We use emissions from an enclosure with a single-slot aperture and equipped with operating electronics to exemplify and model such sources. Spatial correlation functions obtained from two-probe measurements are used both to characterise the source and to propagate the emissions. We examine emissions in the submicrowave frequency range, where evanescent decay dominates the measured correlation function at the distances measured. We find that an approximate, diffusion-like propagator describes the measured emissions well. A phase-space approach based on Wigner functions is exploited to develop this approximation and to provide enhanced understanding of the emissions.


Gradoni, G., Madenoor Ramapriya, D., Creagh, S. C., Tanner, G., Baharuddin, M. H., Nasser, H., …Thomas, D. W. (2017). Near-field scanning and propagation of correlated low-frequency radiated emissions. IEEE Transactions on Electromagnetic Compatibility, 60(6), 2045-2048.

Journal Article Type Article
Acceptance Date Oct 9, 2017
Publication Date Dec 20, 2017
Deposit Date Jan 19, 2018
Publicly Available Date Jan 19, 2018
Journal IEEE Transactions on Electromagnetic Compatibility
Print ISSN 0018-9375
Electronic ISSN 0018-9375
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 60
Issue 6
Pages 2045-2048
Keywords Correlation, near-field scan, radiated emissions,
statistical electromagnetics, Wigner function
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Additional Information (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.


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