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Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method

Fang, Y.; Jayasuriya, D.; Furniss, D.; Tang, Z.Q.; Sojka, ?.; Markos, C.; Sujecki, S.; Seddon, A.B.; Benson, T.M.

Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method Thumbnail


Authors

Y. Fang

D. Jayasuriya

D. Furniss

Z.Q. Tang

?. Sojka

C. Markos

S. Sujecki

ANGELA SEDDON angela.seddon@nottingham.ac.uk
Professor of Inorganic Materials

T.M. Benson



Abstract

The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared (MIR) spectral region (our measurements are over the wavelength range from 2 to 25 μm), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (atomic %) and Ge16As24Se15.5Te44.5 (atomic %) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4% at a wavelength of 3.1 μm by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.

Citation

Fang, Y., Jayasuriya, D., Furniss, D., Tang, Z., Sojka, Ł., Markos, C., …Benson, T. (2017). Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. Optical and Quantum Electronics, 49, Article 237. https://doi.org/10.1007/s11082-017-1057-9

Journal Article Type Article
Acceptance Date May 16, 2017
Online Publication Date Jun 3, 2017
Publication Date Jul 30, 2017
Deposit Date Jun 1, 2017
Publicly Available Date Aug 10, 2018
Journal Optical and Quantum Electronics
Print ISSN 0306-8919
Electronic ISSN 1572-817X
Publisher Springer Verlag
Peer Reviewed Peer Reviewed
Volume 49
Article Number 237
DOI https://doi.org/10.1007/s11082-017-1057-9
Public URL https://nottingham-repository.worktribe.com/output/860504
Publisher URL https://link.springer.com/article/10.1007/s11082-017-1057-9
Contract Date Aug 10, 2018

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