Wigner-Function-Based Propagation of Stochastic Field Emissions from Planar Electromagnetic Sources

Gradoni, Gabriele; Arnault, Luk R.; Creagh, Stephen C.; Tanner, Gregor; Baharuddin, Mohd Hafiz; Smartt, Christopher; Thomas, David W.P.

Abstract

© 1964-2012 IEEE. Modeling the electromagnetic radiation from modern digital systems - acting effectively as extended stochastic sources as part of a complex architecture - is a challenging task. We follow an approach here based on measuring and propagating field-field autocorrelation functions (ACFs) after suitable averaging. From the modeling side, we use the Wigner transform of the ACFs to describe random wave fields in terms of position and direction of propagation variables. An approximate propagator for the components of the radiated magnetic field is constructed for these ACFs based on a linear flow map. Field-field ACFs at the aperture level are obtained from scanning measurements of complex sources. Distance and spatial resolution of the scanning plane is less than a wavelength from the source plane to capture the imprint of evanescent waves in the near-field ACFs. Near-field scanning and efficient near-to-far-field propagation is carried out and compared with measurements. Results of this study will be useful to assist far-field predictions, source reconstruction, and emission source microscopy.

Citation

Gradoni, G., Arnault, L. R., Creagh, S. C., Tanner, G., Baharuddin, M. H., Smartt, C., & Thomas, D. W. (2018). Wigner-Function-Based Propagation of Stochastic Field Emissions from Planar Electromagnetic Sources. IEEE Transactions on Electromagnetic Compatibility, 60(3), 580-588. https://doi.org/10.1109/TEMC.2017.2738329

• Journal Article Type: Article
• Acceptance Date: May 8, 2017
• Online Publication Date: Sep 19, 2017
• Publication Date: Jun 1, 2018
• Deposit Date: May 9, 2017
• Publicly Available Date: Sep 19, 2017
• Journal: IEEE Transactions on Electromagnetic Compatibility
• Print ISSN: 0018-9375
• Electronic ISSN: 1558-187X
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 60
• Issue: 3
• Pages: 580-588
• DOI: https://doi.org/10.1109/TEMC.2017.2738329
• Keywords: Statistical Electromagnetics, Near-field Scan,Wigner Function, Correlation, Reverberation Chamber
• Public URL: https://nottingham-repository.worktribe.com/output/859683
• Publisher URL: https://ieeexplore.ieee.org/document/8046114/
• Additional Information: (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.