All Outputs (2)

Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement (2023)
Conference Proceeding
Hooshmand, H., Liu, M., Pappas, A., Thompson, A., Leach, R., & Piano, S. (2023). Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement.

The most common optical technologies for surface topography measurement are coherence scanning interferometry (CSI), focus variation microscopy (FV) and imaging confocal microscopy (CM). Due to the benefits and drawbacks of each, these instruments ar... Read More about Comparison of coherence scanning interferometry, focus variation and confocal microscopy for surface topography measurement.

Quantifying the validity conditions of the Beckmann-Kirchhoff scattering model (2022)
Conference Proceeding
Hooshmand, H., Liu, M., Leach, R., & Piano, S. (2022). Quantifying the validity conditions of the Beckmann-Kirchhoff scattering model. In D. Kim, H. Choi, & H. Ottevaere (Eds.), Proc. SPIE 12221, Optical Manufacturing and Testing XIV. https://doi.org/10.1117/12.2639003

Approximate and rigorous methods are widely used to model light scattering from a surface. The boundary element method (BEM) is a rigorous model that accounts for polarisation and multiple scattering effects. BEM is suitable to model the scattered li... Read More about Quantifying the validity conditions of the Beckmann-Kirchhoff scattering model.