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All Outputs (7)

Imaging beyond the fundamental slope limit in surface metrology using fluorophore-aided scattering microscopy (2018)
Presentation / Conference

Topography measurement for smooth surfaces with high slopes, e.g. freeform optics, is a challenging task for optical measuring instruments as the light reflected by the tilted surface cannot be sufficiently collected by the objective, resulting in lo... Read More about Imaging beyond the fundamental slope limit in surface metrology using fluorophore-aided scattering microscopy.

Feature-based characterisation of evolving surface topographies in finishing operations for additive manufacturing (2018)
Presentation / Conference

Finishing operations play a fundamental role in the additive manufacture of components. Conventional surface metrology solutions allow for the characterisation of surface roughness through texture parameters, but are not fully suitable to capture the... Read More about Feature-based characterisation of evolving surface topographies in finishing operations for additive manufacturing.