Detailed investigation of defect states in Erbium doped In2O3 thin films
(2017)
Journal Article
Erbium doped Indium Oxide (In2O3:Er) thin films (TFs) were synthesised by spin-on technique. Secondary Ion Mass Spectrometry confirmed that Er is incorporated into the In2O3 lattice and formed an In-O-Er layer. The current–voltage loop produced a low... Read More about Detailed investigation of defect states in Erbium doped In2O3 thin films.