Towards an active learning approach to tool condition monitoring with Bayesian deep learning
(2019)
Conference Proceeding
Martinez Arellano, G., & Ratchev, S. (2019). Towards an active learning approach to tool condition monitoring with Bayesian deep learning
With the current advances in the Internet of Things (IoT), smart sensors and Artificial Intelligence (AI), a new generation of condition monitoring solutions for smart manufacturing is starting to emerge. Computer Numerical Control (CNC) machines can... Read More about Towards an active learning approach to tool condition monitoring with Bayesian deep learning.