Control theory for scanning probe microscopy revisited

Stirling, Julian

Abstract

We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation.

Citation

Stirling, J. (2014). Control theory for scanning probe microscopy revisited. Beilstein Journal of Nanotechnology, 5, https://doi.org/10.3762/bjnano.5.38

• Journal Article Type: Article
• Publication Date: Jan 1, 2014
• Deposit Date: Feb 15, 2016
• Publicly Available Date: Feb 15, 2016
• Journal: Beilstein Journal of Nanotechnology
• Print ISSN: 2190-4286
• Electronic ISSN: 2190-4286
• Publisher: Beilstein-Institut
• Peer Reviewed: Peer Reviewed
• Volume: 5
• DOI: https://doi.org/10.3762/bjnano.5.38
• Keywords: AFM; control theory; feedback; scanning probe microscopy
• Public URL: https://nottingham-repository.worktribe.com/output/999824
• Publisher URL: http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-5-38
• Additional Information: This article is part of the Thematic Series "Advanced atomic force microscopy techniques II".