G.A. Prando
Exciton localization and structural disorder of GaAs1?xBix/GaAs quantum wells grown by molecular beam epitaxy on (311)B GaAs substrates
Prando, G.A.; Orsi Gordo, V.; Puustinen, J.; Hilska, J.; Alghamdi, H.M.; Som, G.; Gunes, M.; Akyol, M.; Souto, S.; Rodrigues, A.D.; Galeti, H.V.A.; Henini, M.; Gobato, Y. Galv�o; Guina, M.
Authors
V. Orsi Gordo
J. Puustinen
J. Hilska
H.M. Alghamdi
G. Som
M. Gunes
M. Akyol
S. Souto
A.D. Rodrigues
H.V.A. Galeti
Professor MOHAMED HENINI MOHAMED.HENINI@NOTTINGHAM.AC.UK
Professor of Applied Physics
Y. Galv�o Gobato
M. Guina
Abstract
In this work, we have investigated the structural and optical properties of GaAs(1?x)Bix/GaAs single quantum wells (QWs) grown by molecular beam epitaxy on GaAs (311)B substrates using x-ray diffraction, atomic force microscopy, Fourier-transform Raman (FT-Raman) and photoluminescence spectroscopy techniques. The FT-Raman results revealed a decrease of the relative intensity ratio of transverse and longitudinal optical modes with the increase of Bi concentration, which indicates a reduction of the structural disorder with increasing Bi incorporation. In addition, the PL results show an enhancement of the optical efficiency of the structures as the Bi concentration is increased due to important effects of exciton localization related to Bi defects, nonradiative centers and alloy disorder. These results provide evidence that Bi is incorporated effectively into the QW region. Finally, the temperature dependence of the PL spectra has evidenced two distinct types of defects related to the Bi incorporation, namely Bi clusters and pairs, and alloy disorder and potential fluctuation.
Citation
Prando, G., Orsi Gordo, V., Puustinen, J., Hilska, J., Alghamdi, H., Som, G., …Guina, M. (2018). Exciton localization and structural disorder of GaAs1−xBix/GaAs quantum wells grown by molecular beam epitaxy on (311)B GaAs substrates. Semiconductor Science and Technology, 33(8), Article 084002. https://doi.org/10.1088/1361-6641/aad02e
Journal Article Type | Article |
---|---|
Acceptance Date | Jun 29, 2018 |
Online Publication Date | Jul 17, 2018 |
Publication Date | Aug 1, 2018 |
Deposit Date | Aug 10, 2018 |
Publicly Available Date | Jul 18, 2019 |
Journal | Semiconductor Science and Technology |
Print ISSN | 0268-1242 |
Electronic ISSN | 1361-6641 |
Publisher | IOP Publishing |
Peer Reviewed | Peer Reviewed |
Volume | 33 |
Issue | 8 |
Article Number | 084002 |
DOI | https://doi.org/10.1088/1361-6641/aad02e |
Keywords | Excitation; Localization; Structural disorder; Photoluminescence; Dilute bismide |
Public URL | https://nottingham-repository.worktribe.com/output/989232 |
Files
Revised Paper QW GaBiAs (311)B - 08Jun18 - Final Resubmission - Copia
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