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Exciton localization and structural disorder of GaAs1?xBix/GaAs quantum wells grown by molecular beam epitaxy on (311)B GaAs substrates

Prando, G.A.; Orsi Gordo, V.; Puustinen, J.; Hilska, J.; Alghamdi, H.M.; Som, G.; Gunes, M.; Akyol, M.; Souto, S.; Rodrigues, A.D.; Galeti, H.V.A.; Henini, M.; Gobato, Y. Galv�o; Guina, M.

Exciton localization and structural disorder of GaAs1?xBix/GaAs quantum wells grown by molecular beam epitaxy on (311)B GaAs substrates Thumbnail


Authors

G.A. Prando

V. Orsi Gordo

J. Puustinen

J. Hilska

H.M. Alghamdi

G. Som

M. Gunes

M. Akyol

S. Souto

A.D. Rodrigues

H.V.A. Galeti

Y. Galv�o Gobato

M. Guina



Abstract

In this work, we have investigated the structural and optical properties of GaAs(1?x)Bix/GaAs single quantum wells (QWs) grown by molecular beam epitaxy on GaAs (311)B substrates using x-ray diffraction, atomic force microscopy, Fourier-transform Raman (FT-Raman) and photoluminescence spectroscopy techniques. The FT-Raman results revealed a decrease of the relative intensity ratio of transverse and longitudinal optical modes with the increase of Bi concentration, which indicates a reduction of the structural disorder with increasing Bi incorporation. In addition, the PL results show an enhancement of the optical efficiency of the structures as the Bi concentration is increased due to important effects of exciton localization related to Bi defects, nonradiative centers and alloy disorder. These results provide evidence that Bi is incorporated effectively into the QW region. Finally, the temperature dependence of the PL spectra has evidenced two distinct types of defects related to the Bi incorporation, namely Bi clusters and pairs, and alloy disorder and potential fluctuation.

Citation

Prando, G., Orsi Gordo, V., Puustinen, J., Hilska, J., Alghamdi, H., Som, G., …Guina, M. (2018). Exciton localization and structural disorder of GaAs1−xBix/GaAs quantum wells grown by molecular beam epitaxy on (311)B GaAs substrates. Semiconductor Science and Technology, 33(8), Article 084002. https://doi.org/10.1088/1361-6641/aad02e

Journal Article Type Article
Acceptance Date Jun 29, 2018
Online Publication Date Jul 17, 2018
Publication Date Aug 1, 2018
Deposit Date Aug 10, 2018
Publicly Available Date Jul 18, 2019
Journal Semiconductor Science and Technology
Print ISSN 0268-1242
Electronic ISSN 1361-6641
Publisher IOP Publishing
Peer Reviewed Peer Reviewed
Volume 33
Issue 8
Article Number 084002
DOI https://doi.org/10.1088/1361-6641/aad02e
Keywords Excitation; Localization; Structural disorder; Photoluminescence; Dilute bismide
Public URL https://nottingham-repository.worktribe.com/output/989232

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