Pablo P�rez
Lateral error compensation for focus variation microscopy
P�rez, Pablo; Syam, Wahyudin P.; Albajez, Jos� Antonio; Santolaria, Jorge; Leach, Richard
Authors
Wahyudin P. Syam
Jos� Antonio Albajez
Jorge Santolaria
RICHARD LEACH RICHARD.LEACH@NOTTINGHAM.AC.UK
Chair in Metrology
Abstract
Focus variation microscopy measures both the areal form and areal surface texture of components. Improvements to the accuracy and precision of focus variation microscopes usually requires measurements with multiple image-fields to compensate lateral stage errors. This paper proposes a methodology for compensation of lateral stage error of a focus variation microscope using an uncalibrated artefact.
Citation
Pérez, P., Syam, W. P., Albajez, J. A., Santolaria, J., & Leach, R. (2018). Lateral error compensation for focus variation microscopy.
Conference Name | 18th EUSPEN International Conference & Exhibition |
---|---|
Acceptance Date | Mar 7, 2018 |
Publication Date | Jun 4, 2018 |
Deposit Date | Mar 23, 2018 |
Publicly Available Date | Jun 4, 2018 |
Peer Reviewed | Peer Reviewed |
Public URL | https://nottingham-repository.worktribe.com/output/936578 |
Files
EUSPEN - Lateral error compensation for focus variation microscopy.pdf
(665 Kb)
PDF
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