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Information-rich surface metrology

Senin, Nicola; Leach, Richard K.

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Nicola Senin


Information-rich metrology refers to the incorporation of any type of available information in the data acquisition and processing pipeline of a measurement process, in order to improve the efficiency and quality of the measurement. In this work, the information-rich metrology paradigm is explored as it is applied to the measurement and characterisation of surface topography. The advantages and challenges of introducing heterogeneous information sources in the surface characterisation pipeline are illustrated. Examples are provided about the incorporation of structured knowledge about a part nominal geometry, the manufacturing processes with their signature topographic features and set-up parameters, and the measurement instruments with their performance characteristics and behaviour in relation to the specific properties of the surfaces being measured. A wide array of surface metrology applications, ranging from product inspection, to surface classification, to defect identification and to the investigation of advanced manufacturing processes, is used to illustrate the information-rich paradigm.

Journal Article Type Article
Acceptance Date May 16, 2018
Online Publication Date Sep 3, 2018
Publication Date Sep 3, 2018
Deposit Date May 21, 2018
Publicly Available Date Sep 3, 2018
Journal Procedia CIRP
Print ISSN 2212-8271
Electronic ISSN 2212-8271
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 75
Pages 19-26
Keywords Surface metrology; Areal topography characterisation; Information rich metrology
Public URL
Publisher URL
Additional Information Paper from 15th CIRP Conference on Computer Aided Tolerancing – CIRP CAT 2018, 11-13 Jun 2018, Milan, Italy.


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