Skip to main content

Research Repository

Advanced Search

Noise evaluation of a point autofocus surface topography measuring instrument

Maculotti, Giacomo; Feng, Xiaobing; Galetto, Maurizio; Leach, Richard K.

Noise evaluation of a point autofocus surface topography measuring instrument Thumbnail


Authors

Giacomo Maculotti

Xiaobing Feng

Maurizio Galetto



Abstract

In this work, the measurement noise of a point autofocus surface topography measuring instrument is evaluated, as the first step towards establishing a route to traceability for this type of instrument. The evaluation is based on the determination of the metrological characteristics for noise as outlined in draft ISO specification standards by using a calibrated optical flat. The static noise and repeatability of the autofocus sensor are evaluated. The influence of environmental disturbances on the measured surface topography and the built-in software to compensate for such influences are also investigated. The instrument was found to have a measurement noise of approximately 2 nm or, when expressed with the measurement bandwidth, 0.4 nm/√Hz for a single-point measurement.

Citation

Maculotti, G., Feng, X., Galetto, M., & Leach, R. K. (2018). Noise evaluation of a point autofocus surface topography measuring instrument. Measurement Science and Technology, 29(6), https://doi.org/10.1088/1361-6501/aab528

Journal Article Type Article
Acceptance Date Mar 8, 2018
Online Publication Date Mar 8, 2018
Publication Date Apr 26, 2018
Deposit Date Mar 12, 2018
Publicly Available Date Mar 9, 2019
Journal Measurement Science and Technology
Print ISSN 0957-0233
Electronic ISSN 1361-6501
Publisher IOP Publishing
Peer Reviewed Peer Reviewed
Volume 29
Issue 6
DOI https://doi.org/10.1088/1361-6501/aab528
Public URL https://nottingham-repository.worktribe.com/output/928731
Publisher URL http://iopscience.iop.org/article/10.1088/1361-6501/aab528/meta
Additional Information This is an author-created, un-copyedited version of an article accepted for publication/published in Measurement Science and Technology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://iopscience.iop.org/article/10.1088/1361-6501/aab528/meta

Files





You might also like



Downloadable Citations