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Quadrature wavelength scanning interferometry

Moschetti, Giuseppe; Forbes, Alistair; Leach, Richard K.; Jiang, Xiang; O’Connor, Daniel


Giuseppe Moschetti

Alistair Forbes

Xiang Jiang

Daniel O’Connor


A novel method to double the measurement range of wavelength scanning interferometry (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, i.e. from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to non-ideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.


Moschetti, G., Forbes, A., Leach, R. K., Jiang, X., & O’Connor, D. (2016). Quadrature wavelength scanning interferometry. Applied Optics, 55(20), 5332-5340.

Journal Article Type Article
Acceptance Date Jun 13, 2016
Online Publication Date Jul 6, 2016
Publication Date Jul 10, 2016
Deposit Date Jul 18, 2016
Publicly Available Date Jul 18, 2016
Journal Applied Optics
Print ISSN 1559-128X
Electronic ISSN 1539-4522
Publisher Optical Society of America
Peer Reviewed Peer Reviewed
Volume 55
Issue 20
Pages 5332-5340
Public URL
Publisher URL
Copyright Statement Copyright information regarding this work can be found at the following address: http://eprints.nottingh.../end_user_agreement.pdf
Additional Information © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.


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Copyright Statement
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