Quadrature wavelength scanning interferometry

Moschetti, Giuseppe; Forbes, Alistair; Leach, Richard K.; Jiang, Xiang; O�Connor, Daniel

Abstract

A novel method to double the measurement range of wavelength scanning interferometry (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, i.e. from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to non-ideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.

Citation

Moschetti, G., Forbes, A., Leach, R. K., Jiang, X., & O’Connor, D. (2016). Quadrature wavelength scanning interferometry. Applied Optics, 55(20), 5332-5340. https://doi.org/10.1364/ao.55.005332

• Journal Article Type: Article
• Acceptance Date: Jun 13, 2016
• Online Publication Date: Jul 6, 2016
• Publication Date: Jul 10, 2016
• Deposit Date: Jul 18, 2016
• Publicly Available Date: Jul 18, 2016
• Journal: Applied Optics
• Print ISSN: 1559-128X
• Electronic ISSN: 2155-3165
• Publisher: Optical Society of America
• Peer Reviewed: Peer Reviewed
• Volume: 55
• Issue: 20
• Pages: 5332-5340
• DOI: https://doi.org/10.1364/ao.55.005332
• Public URL: https://nottingham-repository.worktribe.com/output/802050
• Publisher URL: https://www.osapublishing.org/ao/abstract.cfm?uri=ao-55-20-5332
• Additional Information: © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
• Contract Date: Jul 18, 2016