Xiaobing Feng firstname.lastname@example.org
The development of a snow cleaning system for micro-CMM stylus tips
Feng, Xiaobing; Lawes, Simon; Kinnell, Peter K.
SIMON LAWES S.Lawes@nottingham.ac.uk
Peter K. Kinnell P.Kinnell@lboro.ac.uk
Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of the CMM systems, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. To reduce such errors, this study investigates removing the surface contamination on µCMM stylus tips using a high velocity flow of CO2 gas and sublimated particles. This process is known as snow cleaning. Two different types of snow cleaners were evaluated in the study, and a novel multi-nozzle system developed to address the challenges of cleaning occluded features and balancing forces on the stylus. Studies considered cleaning quality, coverage, and force imparted on the stylus tip. Results have shown that a cleaning force close to the rated probing force of the styli can be achieved. Initial results show that the developed cleaning device was able to eliminate the need for stylus rotation and reduce net force, bringing it closer to on-machine cleaning application.
Feng, X., Lawes, S., & Kinnell, P. K. (2015). The development of a snow cleaning system for micro-CMM stylus tips
|Conference Name||15th International Conference of the European Society for Precision Engineering and Nanotechnology|
|End Date||Jun 5, 2015|
|Acceptance Date||Mar 25, 2015|
|Publication Date||Jun 1, 2015|
|Deposit Date||Jun 7, 2016|
|Peer Reviewed||Peer Reviewed|
|Keywords||snow cleaning system, µCMM, precision cleaning, cleaning force|
|Related Public URLs||http://www.euspen.eu/OurEvents/Leuven2015.aspx|
|Copyright Statement||Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf|
|Additional Information||Published in: Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology. Euspen, 2015, ISBN 9780956679079.|
This file is under embargo due to copyright reasons.
You might also like
Contamination of µCMM stylus tips: on-machine inspection
Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips
Hierarchical-information-based characterization of multiscale structured surfaces