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Surface plasmon microscopic sensing with beam profile modulation

Zhang, Bei; Pechprasarn, Suejit; Somekh, Michael G.


Bei Zhang

Suejit Pechprasarn

Michael G. Somekh


Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show how a phase spatial light modulator (i) performs the necessary pupil function apodization (ii) imposes an angular varying phase shift that effectively changes sample defocus without any mechanical movement and (iii) changes the relative phase of the surface plasmon and reference beam to provide signal enhancement not possible with previous configurations.


Zhang, B., Pechprasarn, S., & Somekh, M. G. (2012). Surface plasmon microscopic sensing with beam profile modulation. Optics Express, 20(27), doi:10.1364/OE.20.028039

Journal Article Type Article
Publication Date Dec 3, 2012
Deposit Date Apr 4, 2014
Publicly Available Date Apr 4, 2014
Journal Optics Express
Electronic ISSN 1094-4087
Publisher Optical Society of America
Peer Reviewed Peer Reviewed
Volume 20
Issue 27
Public URL
Publisher URL


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