Surface plasmon microscopic sensing with beam profile modulation

Zhang, Bei; Pechprasarn, Suejit; Somekh, Michael G.

Abstract

Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show how a phase spatial light modulator (i) performs the necessary pupil function apodization (ii) imposes an angular varying phase shift that effectively changes sample defocus without any mechanical movement and (iii) changes the relative phase of the surface plasmon and reference beam to provide signal enhancement not possible with previous configurations.

Citation

Zhang, B., Pechprasarn, S., & Somekh, M. G. (2012). Surface plasmon microscopic sensing with beam profile modulation. Optics Express, 20(27), https://doi.org/10.1364/OE.20.028039

• Journal Article Type: Article
• Publication Date: Dec 3, 2012
• Deposit Date: Apr 4, 2014
• Publicly Available Date: Apr 4, 2014
• Journal: Optics Express
• Electronic ISSN: 1094-4087
• Publisher: Optical Society of America
• Peer Reviewed: Peer Reviewed
• Volume: 20
• Issue: 27
• DOI: https://doi.org/10.1364/OE.20.028039
• Public URL: https://nottingham-repository.worktribe.com/output/712628
• Publisher URL: http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-27-28039