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Review of the influence of noise in X-ray computed tomography measurement uncertainty

S�nchez, �ngela Rodr�guez; Thompson, Adam; K�rner, Lars; Brierley, Nick; Leach, Richard

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Authors

�ngela Rodr�guez S�nchez

Lars K�rner

Nick Brierley



Abstract

Different aspects of noise in X-ray computed tomography (XCT) for industrial purposes are examined. An overview of the most common noise metrics is given, together with a description of XCT noise influence quantities. We address the current state of the art in understanding the contribution of noise to XCT measurement uncertainty, giving a chronological view of the different attempts that have been made to account for the contribution from noise to XCT measurement uncertainty. We conclude that approaches to estimating the contribution of noise to XCT measurement uncertainty that account for not only noise, but also other factors that affect image quality (e.g., scattering, beam hardening and blurring) are preferable to approaches that only account for noise.

Citation

Sánchez, Á. R., Thompson, A., Körner, L., Brierley, N., & Leach, R. (2020). Review of the influence of noise in X-ray computed tomography measurement uncertainty. Precision Engineering, https://doi.org/10.1016/j.precisioneng.2020.08.004

Journal Article Type Article
Acceptance Date Aug 7, 2020
Online Publication Date Aug 18, 2020
Publication Date Aug 18, 2020
Deposit Date Aug 21, 2020
Publicly Available Date Aug 19, 2021
Journal Precision Engineering
Print ISSN 0141-6359
Publisher Elsevier
Peer Reviewed Peer Reviewed
DOI https://doi.org/10.1016/j.precisioneng.2020.08.004
Public URL https://nottingham-repository.worktribe.com/output/4846192
Publisher URL https://www.sciencedirect.com/science/article/abs/pii/S0141635920306012

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