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A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation

Brown, Hamish G; Pelz, Philipp M; Hsu, Shang-Lin; Zhang, Zimeng; Ramesh, Ramamoorthy; Inzani, Katherine; Sheridan, Evan; Griffin, Sinéad M; Schloz, Marcel; Pekin, Thomas C; Koch, Christoph T; Findlay, Scott D; Allen, Leslie J; Scott, Mary C; Ophus, Colin; Ciston, Jim

Authors

Hamish G Brown

Philipp M Pelz

Shang-Lin Hsu

Zimeng Zhang

Ramamoorthy Ramesh

Evan Sheridan

Sinéad M Griffin

Marcel Schloz

Thomas C Pekin

Christoph T Koch

Scott D Findlay

Leslie J Allen

Mary C Scott

Colin Ophus

Jim Ciston



Abstract

Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, PbgraphicIrgraphicOgraphic, and yttrium-stabilized zirconia, YgraphicZrgraphicOgraphic, heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction. We demonstrate that Pb–Ir atomic columns are visible in the uppermost layers of the reconstructed volume. We compare this approach to the alternative techniques of depth sectioning using differential phase contrast scanning transmission electron microscopy (DPC-STEM) and multislice ptychographic reconstruction.

Citation

Brown, H. G., Pelz, P. M., Hsu, S.-L., Zhang, Z., Ramesh, R., Inzani, K., Sheridan, E., Griffin, S. M., Schloz, M., Pekin, T. C., Koch, C. T., Findlay, S. D., Allen, L. J., Scott, M. C., Ophus, C., & Ciston, J. (2022). A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation. Microscopy and Microanalysis, 28(5), 1632-1640. https://doi.org/10.1017/s1431927622012090

Journal Article Type Article
Acceptance Date May 28, 2022
Online Publication Date Oct 1, 2022
Publication Date Oct 1, 2022
Deposit Date Mar 19, 2025
Journal Microscopy and Microanalysis
Print ISSN 1431-9276
Electronic ISSN 1435-8115
Publisher Cambridge University Press
Peer Reviewed Peer Reviewed
Volume 28
Issue 5
Pages 1632-1640
DOI https://doi.org/10.1017/s1431927622012090
Keywords differential phase contrast, image reconstruction, ptychography, scanning transmission electron microscopy
Public URL https://nottingham-repository.worktribe.com/output/46736372
Publisher URL https://academic.oup.com/mam/article-abstract/28/5/1632/6995538?redirectedFrom=fulltext
Additional Information Copyright © The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America