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High-accuracy surface measurement through modelling of the surface transfer function in interference microscopy

Su, Rong; Thomas, Matthew; Liu, Mingyu; Coupland, Jeremy; Leach, Richard

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Authors

Rong Su

Matthew Thomas

Mingyu Liu

Jeremy Coupland



Contributors

Erik Novak
Editor

James D. Trolinger
Editor

Abstract

Surfaces featuring complex topographies, such as high slope angles, large curvatures and high aspect-ratio structures on both macro- and micro-scales, present significant challenges to optical measuring instruments. Here we demonstrate a method to characterise and correct the three-dimensional surface transfer function (3D STF) of a coherence scanning interferometer (CSI). Slope-dependent errors present in the original measurements are reduced after phase inversion of the 3D STF, and the final results agree with traceable contact stylus measurements within the 30 nm reproducibility of the stylus measurements. This method enables in-situ compensation for errors related to aberrations, defocus and diffraction.

Citation

Su, R., Thomas, M., Liu, M., Coupland, J., & Leach, R. (2019, August). High-accuracy surface measurement through modelling of the surface transfer function in interference microscopy. Presented at Applied Optical Metrology III, San Diego, United States

Presentation Conference Type Conference Paper (published)
Conference Name Applied Optical Metrology III
Start Date Aug 11, 2019
End Date Aug 15, 2019
Acceptance Date Aug 11, 2019
Publication Date Sep 3, 2019
Deposit Date Sep 7, 2019
Publicly Available Date Sep 9, 2019
Journal Proceedings of SPIE - The International Society for Optical Engineering
Print ISSN 0277-786X
Electronic ISSN 1996-756X
Publisher Society of Photo-optical Instrumentation Engineers
Peer Reviewed Peer Reviewed
Volume 11102
Article Number 1110205
ISBN 9781510628977; 9781510628984
DOI https://doi.org/10.1117/12.2528911
Public URL https://nottingham-repository.worktribe.com/output/2585517
Publisher URL https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11102/2528911/High-accuracy-surface-measurement-through-modelling-of-the-surface-transfer/10.1117/12.2528911.short
Contract Date Sep 9, 2019

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