Assessment of Edgewise Insulated Wire Bend Radius Impact on Dielectric Properties of Turn-to-Turn Insulation through Thermal Ageing

Naderiallaf, H.; Degano, M.; Gerada, C.

Abstract

This study aims to evaluate the impact of the bending radius of edgewise insulated wires on dielectric properties such as partial discharge inception voltage (PDIV), partial discharge extinction voltage (PDEV), dielectric dissipation factor (DDF), and insulation capacitance (IC) through thermal ageing. The tests are performed at room temperature (20°C) and atmospheric pressure (1013 mbar) on unaged and thermally aged polytetrafluoroethylene (PTFE)-wrapped pairs of edgewise insulated wires, models of the turn-to-turn insulation. The accelerated thermal ageing is carried out at 250°C (i.e., 50°C higher than thermal class) for two different ageing periods: 156 and 312 hours. To manufacture a coil, it is generally demanded to shape 90-degree bends out of edgewise enamelled winding wires. Therefore, the obtained experimental results are helpful for the coil manufacturers, providing a clue how the bending radius can impact the dielectric properties of turn-to-turn insulation and introducing an optimum radius which can present better insulation performance.

Citation

Naderiallaf, H., Degano, M., & Gerada, C. (2023). Assessment of Edgewise Insulated Wire Bend Radius Impact on Dielectric Properties of Turn-to-Turn Insulation through Thermal Ageing. IEEE Transactions on Dielectrics and Electrical Insulation, https://doi.org/10.1109/TDEI.2023.3309780

• Journal Article Type: Article
• Acceptance Date: Aug 26, 2023
• Online Publication Date: Aug 29, 2023
• Publication Date: Aug 29, 2023
• Deposit Date: Sep 8, 2023
• Publicly Available Date: Sep 13, 2023
• Journal: IEEE Transactions on Dielectrics and Electrical Insulation
• Print ISSN: 1070-9878
• Electronic ISSN: 1558-4135
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• DOI: https://doi.org/10.1109/TDEI.2023.3309780
• Keywords: Wires , Insulation , Partial discharges , Windings , Integrated circuits , Dielectrics , Bending, Accelerated ageing , dielectric losses , dielectric measurement , electric machines , partial discharges , reliability
• Public URL: https://nottingham-repository.worktribe.com/output/24870083
• Publisher URL: https://ieeexplore.ieee.org/document/10233879