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Investigation of optical and electrical properties of erbium-doped TiO2 thin films for photodetector applications

Mondal, Sanjib; Ghosh, Anupam; Rizzo Piton, M.; Gomes, Joaquim P.; Felix, Jorlandio F.; Galv�o Gobato, Y.; Avan�o Galeti, H.V.; Choudhuri, B.; Dhar Dwivedi, S.M.M.; Henini, M.; Mondal, Aniruddha

Investigation of optical and electrical properties of erbium-doped TiO2 thin films for photodetector applications Thumbnail


Authors

Sanjib Mondal

Anupam Ghosh

M. Rizzo Piton

Joaquim P. Gomes

Jorlandio F. Felix

Y. Galv�o Gobato

H.V. Avan�o Galeti

B. Choudhuri

S.M.M. Dhar Dwivedi

Aniruddha Mondal



Abstract

We have investigated the electrical and optical properties of erbium (Er3+) doped TiO2 thin films (Er:TiO2 TFs) grown by sol–gel technique on glass and silicon substrates. The samples were characterized by field emission gun–scanning electron microscopes (FEG–SEM), energy dispersive X-ray spectroscopy (EDX), atomic force microscopy (AFM), X-ray diffraction (XRD), photoluminescence (PL) and current–voltage measurement techniques. FEG–SEM and AFM images showed the morphological change in the structure of Er:TiO2 TFs and EDX analysis confirmed the Er3+ doped into TiO2 lattice. Broad PL emissions in visible and infrared regions were observed in undoped TiO2 samples and associated to different mechanisms due to the anatase and rutile phases. PL spectra revealed sharp peaks at 525 nm, 565 nm, 667 nm and 1.54 µm which are related to Er3+ emissions in Er:TiO2 samples. The undoped TiO2 and Er:TiO2 TFs based UV-photodetectors were fabricated, and various device parameters were investigated. The doped devices exhibit high photoresponse upon illuminating 350 nm UV light at 2 V bias with faster response time compared to undoped device.

Journal Article Type Article
Acceptance Date Sep 19, 2018
Online Publication Date Sep 22, 2018
Publication Date Nov 30, 2018
Deposit Date Oct 15, 2018
Publicly Available Date Sep 23, 2019
Journal Journal of Materials Science: Materials in Electronics
Print ISSN 0957-4522
Electronic ISSN 1573-482X
Publisher Springer Verlag
Peer Reviewed Peer Reviewed
Volume 29
Issue 22
Pages 19588–19600
DOI https://doi.org/10.1007/s10854-018-0090-1
Keywords Sol-gel; TiO2 thin film; Er2O3; Photoluminescence; Photodetectors
Public URL https://nottingham-repository.worktribe.com/output/1146449
Publisher URL https://link.springer.com/article/10.1007/s10854-018-0090-1
Additional Information This is a post-peer-review, pre-copyedit version of an article published in Journal of Materials Science: Materials in Electronics. The final authenticated version is available online at: http://dx.doi.org/10.1007/s10854-018-0090-1

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