S. Marlafeka
RHEED characterisation of the near surface microstructure of Ti-O based biocompatible coatings
Marlafeka, S.; Grant, D.M.; Brown, Paul D.
Authors
D.M. Grant
Paul D. Brown
Contributors
Stephen McVitie
Editor
David McComb
Editor
Abstract
Mechanically polished, annealed, nitric acid treated and aged in boiling water after nitriding, commercially pure Ti substrates have been characterised using reflection high-energy electron diffraction (RHEED) and secondary electron imaging, in terms of their naturally formed or ‘accelerated’ oxide layers. Annealing induced crystallisation and transformation of anatase to the rutile phase and led to increased roughness, with localised fracture and balling up of the surface oxide layer as the time and temperature of annealing were increased. Nitric acid modification produced no influence on the anatase to rutile transformation, whilst further aging in boiling water induced an acceleration of this transformation. RHEED data acquired at differing accelerating voltages have indicated a Ti-O phase gradation within annealed sol-gel derived V modified TiO2 layers deposited by spin coating onto Ti substrates.
Citation
Marlafeka, S., Grant, D., & Brown, P. D. RHEED characterisation of the near surface microstructure of Ti-O based biocompatible coatings. In S. McVitie, & D. McComb (Eds.), Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing
Deposit Date | Mar 25, 2011 |
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Peer Reviewed | Peer Reviewed |
Issue | 179 |
Series Title | Institute of Physics conference series |
Book Title | Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003 |
ISBN | 750309679 |
Keywords | RHEED Titanium TiO2 Biocompatible |
Public URL | https://nottingham-repository.worktribe.com/output/1021658 |
Related Public URLs | http://iopscience.iop.org/ |
Files
Inst._Phys._Conf._Ser._179_(2004)_pp_155-158.pdf
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