TEM tomography of pores with application to computational nanoscale flows in nanoporous silicon nitride (NPN)
(2018)
Journal Article
Silicon nanomembrane technologies (NPN, pnc-Si, and others) have been used commercially as electron microscopy (EM) substrates, and as filters with nanometer-resolution size cut-offs. Combined with EM, these materials provide a platform for catching... Read More about TEM tomography of pores with application to computational nanoscale flows in nanoporous silicon nitride (NPN).