Outputs (9)

A microscopy approach for in situ inspection of the μCMM stylus for contamination (2017)
Journal Article
Feng, X., Pascal, J., & Lawes, S. (in press). A microscopy approach for in situ inspection of the μCMM stylus for contamination. Measurement Science and Technology, 28(9), https://doi.org/10.1088/1361-6501/aa7c93

During the µCMM measurement process, contamination gradually builds up on the surface of the stylus tip and affects dimensional accuracy of the measurement. Regular inspection of the stylus for contamination is essential in determining the appropriat... Read More about A microscopy approach for in situ inspection of the μCMM stylus for contamination.

Coherence scanning interferometry for additive manufacture (2017)
Presentation / Conference Contribution
Gomez, C., Thompson, A., DiSciacca, J., Lawes, S., & Leach, R. Coherence scanning interferometry for additive manufacture. Presented at 16th Conference on Metrology and properties of Engineering Surfaces

Additive manufacture (AM) of metal components is a rapidly maturing technology; but given the large number of interrelated process parameters, it remains difficult to control to high precision. It has been observed that processing conditions may be a... Read More about Coherence scanning interferometry for additive manufacture.

X-ray computed tomography of additively manufactured metal parts: the effect of magnification and reconstruction sampling on surface topography measurement (2017)
Presentation / Conference Contribution
Thompson, A., Körner, L., Senin, N., Lawes, S., Leach, R., & Maskery, I. X-ray computed tomography of additively manufactured metal parts: the effect of magnification and reconstruction sampling on surface topography measurement. Presented at 16th Conference on Metrology and properties of Engineering Surfaces

X-ray computed tomography (XCT) has recently become recognised as a viable method of surface topography measurement for additively manufactured (AM) metal parts [1–5]. AM is capable of producing internal features that are inaccessible to other surfac... Read More about X-ray computed tomography of additively manufactured metal parts: the effect of magnification and reconstruction sampling on surface topography measurement.

An industrial survey on the use of surface texture parameters (2017)
Presentation / Conference Contribution
Todhunter, L. D., Leach, R., & Lawes, S. D. An industrial survey on the use of surface texture parameters. Presented at 16th Conference on Metrology and properties of Engineering Surfaces

In 1999, CIRP conducted an industrial survey of the use of surface texture parameters [1]. In the seventeen years since, much has changed, with the most important advancement being the introduction of areal surface texture parameters as described in... Read More about An industrial survey on the use of surface texture parameters.

Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips (2016)
Journal Article
Feng, X., Kinnell, P. K., & Lawes, S. (in press). Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips. Measurement Science and Technology, 28(1), https://doi.org/10.1088/1361-6501/28/1/015007

Contamination adhered to the surface of a µCMM stylus tip compromises the measurement accuracy of the µCMM system, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. In prior work by the autho... Read More about Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips.

Contamination of µCMM stylus tips: on-machine inspection (2016)
Presentation / Conference Contribution
Feng, X., Lacorne, C., Fernandes, G. Q., Lawes, S., & Kinnell, P. Contamination of µCMM stylus tips: on-machine inspection. Presented at 16th International Conference of the European Society for Precision Engineering and Nanotechnology

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of a µCMM system. Regular cleaning of the stylus is essential to minimising the dimensional error but little data exists for determining appropri... Read More about Contamination of µCMM stylus tips: on-machine inspection.

Performance assessment of a new variable stiffness probing system for micro-CMMs (2016)
Journal Article
Alblahaihid, K., Kinnell, P., Lawes, S., Desgaches, D., & Leach, R. K. (2016). Performance assessment of a new variable stiffness probing system for micro-CMMs. Sensors, 16(4), Article 492. https://doi.org/10.3390/s16040492

When designing micro-scale tactile probes, a design trade-off must be made between the stiffness and flexibility of the probing element. The probe must be flexible enough to ensure sensitive parts are not damaged during contact, but it must be stiff... Read More about Performance assessment of a new variable stiffness probing system for micro-CMMs.

The development of a snow cleaning system for micro-CMM stylus tips (2015)
Presentation / Conference Contribution
Feng, X., Lawes, S., & Kinnell, P. K. The development of a snow cleaning system for micro-CMM stylus tips. Presented at 15th International Conference of the European Society for Precision Engineering and Nanotechnology

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of the CMM systems, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. To reduce such e... Read More about The development of a snow cleaning system for micro-CMM stylus tips.

Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips (2015)
Presentation / Conference Contribution
Feng, X., Lawes, S., & Kinnell, P. K. Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips. Presented at 4M/ICOMM2015 Conference

The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To... Read More about Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips.