Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy

Patel, Rikesh; Li, Wenqi; Smith, Richard J.; Sharples, Steve D.; Clark, Matt

Abstract

Due to its economical production process polysilicon, or multicrystalline silicon, is widely used to produce solar cell wafers. However, the conversion efficiencies are often lower than equivalent monocrystalline or thin film cells, with the structure and orientation of the silicon grains strongly linked to the efficiency. We present a non-destructive laser ultrasonic inspection technique, capable of characterising large (52 x 76 mm2) photocell's microstructure – measurement times, sample surface preparation and system upgrades for silicon scanning are discussed. This system, known as spatially resolved acoustic spectroscopy (SRAS) could be used to optimise the polysilicon wafer production process and potentially improve efficiency.

Citation

Patel, R., Li, W., Smith, R. J., Sharples, S. D., & Clark, M. (2017). Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy. Scripta Materialia, 140, 67-70. https://doi.org/10.1016/j.scriptamat.2017.07.003

• Journal Article Type: Article
• Acceptance Date: Jul 6, 2017
• Online Publication Date: Jul 14, 2017
• Publication Date: 2017-11
• Deposit Date: Jul 14, 2017
• Publicly Available Date: Jul 14, 2017
• Journal: Scripta Materialia
• Print ISSN: 1359-6462
• Electronic ISSN: 1359-6462
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 140
• Pages: 67-70
• DOI: https://doi.org/10.1016/j.scriptamat.2017.07.003
• Keywords: Acoustic methods, Solar cells, Crystal structure, Microstructure, Nondestructive testing
• Public URL: https://nottingham-repository.worktribe.com/output/965137
• Publisher URL: http://www.sciencedirect.com/science/article/pii/S1359646217303846