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Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy

Patel, Rikesh; Li, Wenqi; Smith, Richard J.; Sharples, Steve D.; Clark, Matt

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Authors

WENQI LI Wenqi.Li@nottingham.ac.uk
Senior Research Fellow

Steve D. Sharples

MATT CLARK matt.clark@nottingham.ac.uk
Professor of Applied Optics



Abstract

Due to its economical production process polysilicon, or multicrystalline silicon, is widely used to produce solar cell wafers. However, the conversion efficiencies are often lower than equivalent monocrystalline or thin film cells, with the structure and orientation of the silicon grains strongly linked to the efficiency. We present a non-destructive laser ultrasonic inspection technique, capable of characterising large (52 x 76 mm2) photocell's microstructure – measurement times, sample surface preparation and system upgrades for silicon scanning are discussed. This system, known as spatially resolved acoustic spectroscopy (SRAS) could be used to optimise the polysilicon wafer production process and potentially improve efficiency.

Citation

Patel, R., Li, W., Smith, R. J., Sharples, S. D., & Clark, M. (2017). Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy. Scripta Materialia, 140, 67-70. https://doi.org/10.1016/j.scriptamat.2017.07.003

Journal Article Type Article
Acceptance Date Jul 6, 2017
Online Publication Date Jul 14, 2017
Publication Date 2017-11
Deposit Date Jul 14, 2017
Publicly Available Date Jul 14, 2017
Journal Scripta Materialia
Print ISSN 1359-6462
Electronic ISSN 1872-8456
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 140
Pages 67-70
DOI https://doi.org/10.1016/j.scriptamat.2017.07.003
Keywords Acoustic methods, Solar cells, Crystal structure, Microstructure, Nondestructive testing
Public URL https://nottingham-repository.worktribe.com/output/965137
Publisher URL http://www.sciencedirect.com/science/article/pii/S1359646217303846
Contract Date Jul 14, 2017

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