Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module With Embedded Decoupling Capacitors

O Brien, John; Yang, Li; Li, Ke; Dai, Jingru; Corfield, Martin; Harris, Anne; Paciura, Krzysztof; O'Brien, John; Johnson, C. Mark

Abstract

Integration of decoupling capacitors in SiC MOSFET modules is an advanced solution to mitigate the effect of parasitic inductance induced by module assembly interconnects. In this paper, the switching transient behavior is reported for a 1.2kV SiC MOSFET module with embedded DC-link capacitors. It shows faster switching transition and less overshoot voltage compared to a module using an identical package but without capacitors. Active power cycling and passive temperature cycling are carried out for package reliability characterization and comparisons are made with commercial Si and SiC power modules. Scanning acoustic microscopy images and thermal structure functions are presented to quantify the effects of package degradation. The results demonstrate that the SiC modules with embedded capacitors have similar reliability performance to commercial modules and that the reliability is not adversely affected by the presence of the decoupling capacitors.

Citation

O Brien, J., Yang, L., Li, K., Dai, J., Corfield, M., Harris, A., …Johnson, C. M. (2018). Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module With Embedded Decoupling Capacitors. IEEE Transactions on Power Electronics, 33(12), 10594-10601. https://doi.org/10.1109/TPEL.2018.2809923

• Journal Article Type: Article
• Acceptance Date: Feb 12, 2018
• Online Publication Date: Mar 16, 2018
• Publication Date: 2018-12
• Deposit Date: Mar 12, 2018
• Publicly Available Date: Mar 16, 2018
• Journal: IEEE Transactions on Power Electronics
• Print ISSN: 0885-8993
• Electronic ISSN: 1941-0107
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 33
• Issue: 12
• Pages: 10594-10601
• DOI: https://doi.org/10.1109/TPEL.2018.2809923
• Keywords: SiC, MOSFET module, embedded capacitor, switching performance, thermo-mechanical reliability
• Public URL: https://nottingham-repository.worktribe.com/output/926524
• Publisher URL: https://ieeexplore.ieee.org/abstract/document/8318641/