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Statistical description of inhomogeneous samples by scanning microwave microscopy

Monti, Tamara; Udoudo, O.B.; Sperin, Kevin A.; Dodds, Chris; Kingman, S.W.; Jackson, Timothy J.

Authors

Tamara Monti

O.B. Udoudo

Kevin A. Sperin

CHRIS DODDS CHRIS.DODDS@NOTTINGHAM.AC.UK
Professor of Process Engineering

SAM KINGMAN SAM.KINGMAN@NOTTINGHAM.AC.UK
Pro-Vice Chancellor Faculty of Engineering

Timothy J. Jackson



Abstract

A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample were performed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip.

Citation

Monti, T., Udoudo, O., Sperin, K. A., Dodds, C., Kingman, S., & Jackson, T. J. (2017). Statistical description of inhomogeneous samples by scanning microwave microscopy. IEEE Transactions on Microwave Theory and Techniques, 65(6), https://doi.org/10.1109/TMTT.2016.2642940

Journal Article Type Article
Acceptance Date Dec 18, 2016
Online Publication Date Jan 19, 2017
Publication Date Jun 1, 2017
Deposit Date Jan 27, 2017
Publicly Available Date Mar 29, 2024
Journal IEEE Transactions on Microwave Theory and Techniques
Print ISSN 0018-9480
Electronic ISSN 0018-9480
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 65
Issue 6
DOI https://doi.org/10.1109/TMTT.2016.2642940
Keywords Dielectric constant, dielectric materials, Maxwell–Garnett approximation, microwave measurements,
near-field measurements, nonhomogeneous media, scanning
microwave microscope (SMM), statistical distributions
Public URL https://nottingham-repository.worktribe.com/output/863258
Publisher URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7827118

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