Tamara Monti
Statistical description of inhomogeneous samples by scanning microwave microscopy
Monti, Tamara; Udoudo, O.B.; Sperin, Kevin A.; Dodds, Chris; Kingman, S.W.; Jackson, Timothy J.
Authors
O.B. Udoudo
Kevin A. Sperin
Professor CHRIS DODDS CHRIS.DODDS@NOTTINGHAM.AC.UK
PROFESSOR OF PROCESS ENGINEERING
Professor SAM KINGMAN SAM.KINGMAN@NOTTINGHAM.AC.UK
Interim Provost and Deputy Vice Chancellor
Timothy J. Jackson
Abstract
A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample were performed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip.
Citation
Monti, T., Udoudo, O., Sperin, K. A., Dodds, C., Kingman, S., & Jackson, T. J. (2017). Statistical description of inhomogeneous samples by scanning microwave microscopy. IEEE Transactions on Microwave Theory and Techniques, 65(6), https://doi.org/10.1109/TMTT.2016.2642940
Journal Article Type | Article |
---|---|
Acceptance Date | Dec 18, 2016 |
Online Publication Date | Jan 19, 2017 |
Publication Date | Jun 1, 2017 |
Deposit Date | Jan 27, 2017 |
Publicly Available Date | Jan 27, 2017 |
Journal | IEEE Transactions on Microwave Theory and Techniques |
Print ISSN | 0018-9480 |
Electronic ISSN | 1557-9670 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 65 |
Issue | 6 |
DOI | https://doi.org/10.1109/TMTT.2016.2642940 |
Keywords | Dielectric constant, dielectric materials, Maxwell–Garnett approximation, microwave measurements, near-field measurements, nonhomogeneous media, scanning microwave microscope (SMM), statistical distributions |
Public URL | https://nottingham-repository.worktribe.com/output/863258 |
Publisher URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7827118 |
Contract Date | Jan 27, 2017 |
Files
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