Verification of micro-scale photogrammetry for smooth three-dimensional object measurement

Sims-Waterhouse, Danny; Piano, Samanta; Leach, Richard

Abstract

© 2017 IOP Publishing Ltd. By using sub-millimetre laser speckle pattern projection we show that photogrammetry systems are able to measure smooth three-dimensional objects with surface height deviations less than 1 μm. The projection of laser speckle patterns allows correspondences on the surface of smooth spheres to be found, and as a result, verification artefacts with low surface height deviations were measured. A combination of VDI/VDE and ISO standards were also utilised to provide a complete verification method, and determine the quality parameters for the system under test. Using the proposed method applied to a photogrammetry system, a 5 mm radius sphere was measured with an expanded uncertainty of 8.5 μm for sizing errors, and 16.6 μm for form errors with a 95 confidence interval. Sphere spacing lengths between 6 mm and 10 mm were also measured by the photogrammetry system, and were found to have expanded uncertainties of around 20 μm with a 95 confidence interval.

Citation

Sims-Waterhouse, D., Piano, S., & Leach, R. (2017). Verification of micro-scale photogrammetry for smooth three-dimensional object measurement. Measurement Science and Technology, 28(5), Article 055010. https://doi.org/10.1088/1361-6501/aa6364

• Journal Article Type: Article
• Acceptance Date: Feb 24, 2017
• Online Publication Date: Mar 17, 2017
• Publication Date: Mar 17, 2017
• Deposit Date: Feb 28, 2017
• Publicly Available Date: Mar 17, 2017
• Journal: Measurement Science and Technology
• Print ISSN: 0957-0233
• Electronic ISSN: 1361-6501
• Publisher: IOP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 28
• Issue: 5
• Article Number: 055010
• DOI: https://doi.org/10.1088/1361-6501/aa6364
• Keywords: photogrammetry, uncertainty, laser speckle, coordinate metrology
• Public URL: https://nottingham-repository.worktribe.com/output/850820
• Publisher URL: http://iopscience.iop.org/article/10.1088/1361-6501/aa6364/meta
• Additional Information: This is an author-created, un-copyedited version of an article accepted for publication in Measurement Science and Technology. The publisher is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://iopscience.iop.org/article/10.1088/1361-6501/aa6364/meta
• Contract Date: Feb 28, 2017