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What can explain the Chinese patent explosion?

Eberhardt, Markus; Helmers, Christian; Yu, Zhihong

Authors

Christian Helmers

ZHIHONG YU ZHIHONG.YU@NOTTINGHAM.AC.UK
Associate Professor



Abstract

We analyse the ‘explosion’ of patent filings by Chinese residents both domestically and in the United States during the early 2000s, employing a unique dataset of 374,000 firms matching patent applications to manufacturing census data. Our analysis reveals that patenting is highly concentrated among a small number of firms, operating in the information and communication technology sector. Although increases in patent filings by these companies are partly driven by increased R&D intensity, our analysis suggests that the explosion of patent filings at the Chinese patent office is driven by factors other than underlying innovative behavior, including government subsidies that encourage patent filings directly.

Journal Article Type Article
Publication Date Jan 1, 2017
Journal Oxford Economic Papers
Print ISSN 0030-7653
Electronic ISSN 0030-7653
Publisher Oxford University Press
Peer Reviewed Peer Reviewed
Volume 69
Issue 1
APA6 Citation Eberhardt, M., Helmers, C., & Yu, Z. (2017). What can explain the Chinese patent explosion?. Oxford Economic Papers, 69(1), https://doi.org/10.1093/oep/gpw042
DOI https://doi.org/10.1093/oep/gpw042
Publisher URL https://academic.oup.com/oep/article-lookup/doi/10.1093/oep/gpw042
Copyright Statement Copyright information regarding this work can be found at the following address: http://eprints.nottingh.../end_user_agreement.pdf
Additional Information This is a pre-copyedited, author-produced PDF of an article accepted for publication in Oxford Economic Papers following peer review. The version of record Markus Eberhardt, Christian Helmers, Zhihong Yu; What can explain the Chinese patent explosion?. Oxf Econ Pap 2017; 69 (1): 239-262. doi: 10.1093/oep/gpw042 is available online at: https://academic.oup.co.../doi/10.1093/oep/gpw042

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Copyright Statement
Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf





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