Measuring the reactivity of a silicon-terminated probe

Sweetman, Adam; Stirling, Julian; Jarvis, Samuel Paul; Rahe, Philipp; Moriarty, Philip

Abstract

It is generally accepted that the exposed surfaces of silicon crystals are highly reactive due to the dangling bonds which protrude into the vacuum. However, surface reconstruction can not only modify the reactivity of bulk silicon crystals, but plays a key role in determining the properties of silicon nanocrystals. In this study we probe the reactivity of silicon clusters at the end of a scanning probe tip by examining their interaction with closed shell fullerene molecules. Counter to intuitive expectations, many silicon clusters do not react strongly with the fullerene cage, and we find that only specific highly oriented clusters have sufficient reactivity to break open the existing carbon-carbon bonds.

Citation

Sweetman, A., Stirling, J., Jarvis, S. P., Rahe, P., & Moriarty, P. (2016). Measuring the reactivity of a silicon-terminated probe. Physical Review B, 94(11), Article 115440. https://doi.org/10.1103/PhysRevB.94.115440

• Journal Article Type: Article
• Acceptance Date: Aug 18, 2016
• Online Publication Date: Sep 30, 2016
• Publication Date: Sep 30, 2016
• Deposit Date: Sep 20, 2016
• Publicly Available Date: Sep 30, 2016
• Journal: Physical Review B
• Print ISSN: 2469-9950
• Electronic ISSN: 2469-9969
• Publisher: American Physical Society
• Peer Reviewed: Peer Reviewed
• Volume: 94
• Issue: 11
• Article Number: 115440
• DOI: https://doi.org/10.1103/PhysRevB.94.115440
• Public URL: https://nottingham-repository.worktribe.com/output/808719
• Publisher URL: https://journals.aps.org/prb/abstract/10.1103/PhysRevB.94.115440
• Contract Date: Sep 20, 2016