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Measuring the reactivity of a silicon-terminated probe

Sweetman, Adam; Stirling, Julian; Jarvis, Samuel Paul; Rahe, Philipp; Moriarty, Philip

Authors

Adam Sweetman

Julian Stirling

Samuel Paul Jarvis

Philipp Rahe



Abstract

It is generally accepted that the exposed surfaces of silicon crystals are highly reactive due to the dangling bonds which protrude into the vacuum. However, surface reconstruction can not only modify the reactivity of bulk silicon crystals, but plays a key role in determining the properties of silicon nanocrystals. In this study we probe the reactivity of silicon clusters at the end of a scanning probe tip by examining their interaction with closed shell fullerene molecules. Counter to intuitive expectations, many silicon clusters do not react strongly with the fullerene cage, and we find that only specific highly oriented clusters have sufficient reactivity to break open the existing carbon-carbon bonds.

Journal Article Type Article
Publication Date Sep 30, 2016
Journal Physical Review B
Print ISSN 2469-9950
Electronic ISSN 2469-9969
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 94
Issue 11
Article Number 115440
APA6 Citation Sweetman, A., Stirling, J., Jarvis, S. P., Rahe, P., & Moriarty, P. (2016). Measuring the reactivity of a silicon-terminated probe. Physical Review B, 94(11), https://doi.org/10.1103/PhysRevB.94.115440
DOI https://doi.org/10.1103/PhysRevB.94.115440
Publisher URL https://journals.aps.org/prb/abstract/10.1103/PhysRevB.94.115440
Copyright Statement Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0

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Copyright Statement
Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0





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