Time-frequency enhancement technique for bevel gear fault diagnosis

Hartono, Dennis; Halim, Dunant; Widodo, Achmad; Roberts, Gethin Wyn

Abstract

Gear failure is one of the most common causes of breakdown in rotating machineries. It is well known that vibration signals from machineries can be effectively used to detect certain gear faults. Yet it is still not an easy task to find a symptom that reflects a particular fault from vibration signals. This paper presents an advanced time-frequency signal processing technique for extracting important gear fault information from the vibration signal that is heavily corrupted by measurement noise. Experiments were performed on a bevel gearbox test rig using vibration measurements. The Time Synchronous Average (TSA) was initially utilized to eliminate all asynchronous component of vibration signal obtained from the gear. The Continuous Wavelet Transform (CWT) method was then used to capture the non-stationary behaviour of the impulse signal generated from the broken bevel gear tooth. It was shown that the diagnosis method using the Continuous Wavelet Transform combined with Time Synchronous Averaging outperformed the conventional spectral analysis, capable of identifying the angular location of broken teeth in the gear.

Citation

Hartono, D., Halim, D., Widodo, A., & Roberts, G. W. (in press). Time-frequency enhancement technique for bevel gear fault diagnosis. MATEC Web of Conferences, 70, Article 02003. https://doi.org/10.1051/matecconf/20167002003

• Journal Article Type: Article
• Acceptance Date: Jan 1, 2016
• Online Publication Date: Aug 11, 2016
• Deposit Date: Oct 20, 2017
• Publicly Available Date: Oct 20, 2017
• Journal: MATEC Web of Conferences
• Electronic ISSN: 2261-236X
• Publisher: EDP Open
• Peer Reviewed: Peer Reviewed
• Volume: 70
• Article Number: 02003
• DOI: https://doi.org/10.1051/matecconf/20167002003
• Public URL: https://nottingham-repository.worktribe.com/output/805826
• Publisher URL: https://www.matec-conferences.org/articles/matecconf/abs/2016/33/matecconf_icmit2016_02003/matecconf_icmit2016_02003.html