A General Description of the Performance of Surface Plasmon Sensors Using a Transmission Line Resonant Circuit Model

Shen, Mengqi; Somekh, Michael G.

Abstract

We analyze the response of surface plasmon (SP) sensors using a transmission line model. We illustrate this analysis with particular reference to a layered structure in which plasmon hybridization occurs. By applying the appropriate resonant condition to the system, we derive a circuit model which predicts the responsivity of different modes. This gives new physical insight into the sensing process. We discuss how the change in the sample region may be modeled as a change in the reactance in the equivalent circuit and from this, it follows that a single parameter can determine the change in resonance position with reactance. This approach is used to predict the response of a generic sensor to binding of an analyte and the bulk change of refractive index. This parameter arises naturally from the circuit representation in a way not readily accessible with the transfer matrix approach. The parameters can be expressed in terms of the Q of a resonant circuit and confirms the intuition that a high Q is associated with poor responsivity, however, we demonstrate that there is another circuit parameter, the resistance at resonance, that can mitigate this effect, providing a route for optimization of the sensor properties.

Citation

Shen, M., & Somekh, M. G. (2019). A General Description of the Performance of Surface Plasmon Sensors Using a Transmission Line Resonant Circuit Model. IEEE Sensors Journal, 19(23), 11281-11288. https://doi.org/10.1109/jsen.2019.2933320

• Journal Article Type: Article
• Acceptance Date: Jul 21, 2019
• Online Publication Date: Aug 5, 2020
• Publication Date: Dec 1, 2019
• Deposit Date: Nov 4, 2020
• Publicly Available Date: Nov 4, 2020
• Journal: IEEE Sensors Journal
• Print ISSN: 1530-437X
• Electronic ISSN: 1558-1748
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 19
• Issue: 23
• Pages: 11281-11288
• DOI: https://doi.org/10.1109/jsen.2019.2933320
• Keywords: Instrumentation; Electrical and Electronic Engineering
• Public URL: https://nottingham-repository.worktribe.com/output/5017982
• Publisher URL: https://ieeexplore.ieee.org/document/8788574