Defocus leakage radiation microscopy for single shot surface plasmon measurement

Chow, Terry W K; Lun, Daniel P K; Pechprasarn, Suejit; Somekh, Michael G.

Abstract

Measurement of surface plasmon and surface wave propagation is important for the operation and characterization of sensors and microscope systems. One challenge is to perform these measurements both quickly and with good spatial resolution without any modification to the sample surface. This paper addresses these issues by projecting an image of the field excited from a defocused sample to a magnified image plane. By carefully analysing the intensity distribution in this plane the properties of the surface waves generated on the sample surface can be determined. This has the advantage over previous techniques that the data can be obtained in a single shot without any changes to the focal position of the sample. Equally importantly, we show the method measures the local properties of the sample at well-defined positions, whereas other methods such as direct observation of the back focal plane average the properties over the propagation length of the surface waves.

Citation

Chow, T. W. K., Lun, D. P. K., Pechprasarn, S., & Somekh, M. G. (2020). Defocus leakage radiation microscopy for single shot surface plasmon measurement. Measurement Science and Technology, 31(7), Article 075401. https://doi.org/10.1088/1361-6501/ab7def

• Journal Article Type: Article
• Acceptance Date: Mar 9, 2020
• Online Publication Date: Apr 29, 2020
• Publication Date: Jul 1, 2020
• Deposit Date: Oct 22, 2020
• Publicly Available Date: Oct 22, 2020
• Journal: Measurement Science and Technology
• Print ISSN: 0957-0233
• Electronic ISSN: 1361-6501
• Publisher: IOP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 31
• Issue: 7
• Article Number: 075401
• DOI: https://doi.org/10.1088/1361-6501/ab7def
• Keywords: Instrumentation; Applied Mathematics
• Public URL: https://nottingham-repository.worktribe.com/output/4983652
• Publisher URL: https://iopscience.iop.org/article/10.1088/1361-6501/ab7def
• Additional Information: Journal title: Measurement Science and Technology; Article type: paper; Article title: Defocus leakage radiation microscopy for single shot surface plasmon measurement; Copyright information: © 2020 The Author(s). Published by IOP Publishing Ltd; License information: CC BY 4.0 Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.; Date received: 2019-07-06; Date accepted: 2020-03-09; Online publication date: 2020-04-24