Life Characterization of PEEK and Nanofilled Enamel Insulated Wires Under Thermal Ageing

Khowja, Muhammad Raza; Vakil, Gaurang; Ahmad, Syed Shahjahan; Ramanathan, Ramkumar; Gerada, Chris; Benarous, Maamar

Abstract

This paper characterizes and develops life models for two different wire insulating materials: Poly-ether-ketone (PEEK) and nanofilled enamel (Allotherm wire). The article focuses on predicting the lifespan of PEEK and Allotherm wire insulating materials, specifically for use in low-voltage electrical machines. The study investigates the effects of thermal ageing in terms of dissipation factor, insulation capacitance, and partial discharge inception voltage (PDIV). Delamination of the insulation layer is observed in both wires during the ageing process, resulting in an increase in the differential dissipation factor and insulation capacitance. With respect to its unaged condition, Allotherm wire exhibits faster degradation, showing 2.4- and 4.5-times higher changes in the differential dissipation factor and insulation capacitance respectively compared to PEEK wire after the 16th ageing cycle. In addition, Allotherm wire experiences faster deterioration of the PDIV, with a 42% reduction compared to 32% in PEEK after the same ageing cycle. Using a single-stress Arrhenius life model, the study estimates the relative thermal index (RTI) for both materials as 245°C for PEEK and 226.25°C for Allotherm wire. These results indicate a 72.1% decrease in the lifetime of PEEK and a 25.5% decrease in the lifetime of Allotherm wire when compared to the manufacturer’s RTI specification.

Citation

Khowja, M. R., Vakil, G., Ahmad, S. S., Ramanathan, R., Gerada, C., & Benarous, M. (2024). Life Characterization of PEEK and Nanofilled Enamel Insulated Wires Under Thermal Ageing. IEEE Access, 12, 39470- 39483. https://doi.org/10.1109/access.2024.3374637

• Journal Article Type: Article
• Acceptance Date: Feb 28, 2024
• Online Publication Date: Mar 7, 2024
• Publication Date: 2024
• Deposit Date: Apr 29, 2024
• Publicly Available Date: Apr 29, 2024
• Journal: IEEE Access
• Electronic ISSN: 2169-3536
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 12
• Pages: 39470- 39483
• DOI: https://doi.org/10.1109/access.2024.3374637
• Public URL: https://nottingham-repository.worktribe.com/output/32179163
• Publisher URL: https://ieeexplore.ieee.org/document/10462135