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State of the Art of Near-Field Scanning: Contemporary Standards and Methods

Voskresenskyi, Sviatoslav; Aitbar, Iqra; Ballukja, Erjon; Niewiadomski, Karol; Thomas, David W.P.; Greedy, Steve

State of the Art of Near-Field Scanning: Contemporary Standards and Methods Thumbnail


Authors

IQRA AITBAR IQRA.AITBAR1@NOTTINGHAM.AC.UK
Marie Sklodowska-Curie E-Tut Early Stage Researcher

Erjon Ballukja

Karol Niewiadomski

David W.P. Thomas



Abstract

This paper presents a review of a number of techniques used for near-field scanning and detection of electromagnetic radiation sources. It also gives an overview of standards, related to technical requirements for the devices as well as scanning methods. Subsequently, a comparison between Far Field (FF) and Near Field (NF) is given. We present the advantages of NF over FF, and list the common problems for NF scanning, such as calibration, protraction in overall scanning time. Finally, we refer the possible solutions and improvements for scanning setup and software.

Conference Name 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
Conference Location Nusa Dua, Indonesia
Start Date Jan 19, 2023
End Date Jan 20, 2023
Acceptance Date Dec 1, 2022
Online Publication Date Mar 28, 2023
Publication Date Mar 28, 2023
Deposit Date Apr 12, 2023
Publicly Available Date Apr 12, 2023
Publisher IEEE
Pages 29-30
Series Title Global Electromagnetic Compatibility Conference (GEMCCON)
Book Title 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
ISBN 9798350396942
DOI https://doi.org/10.1109/GEMCCON57842.2023.10078194
Keywords Technical requirements , Surface reconstruction , Surface waves , Software , Calibration , Noise measurement , Finite wordlength effects, EMC , Near-Field , Far-Field , time domain , frequency domain , standards , compliance
Public URL https://nottingham-repository.worktribe.com/output/19454276
Publisher URL https://ieeexplore.ieee.org/document/10078194

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