State of the Art of Near-Field Scanning: Contemporary Standards and Methods

Voskresenskyi, Sviatoslav; Aitbar, Iqra; Ballukja, Erjon; Niewiadomski, Karol; Thomas, David W.P.; Greedy, Steve

Abstract

This paper presents a review of a number of techniques used for near-field scanning and detection of electromagnetic radiation sources. It also gives an overview of standards, related to technical requirements for the devices as well as scanning methods. Subsequently, a comparison between Far Field (FF) and Near Field (NF) is given. We present the advantages of NF over FF, and list the common problems for NF scanning, such as calibration, protraction in overall scanning time. Finally, we refer the possible solutions and improvements for scanning setup and software.

Citation

Voskresenskyi, S., Aitbar, I., Ballukja, E., Niewiadomski, K., Thomas, D. W., & Greedy, S. (2023). State of the Art of Near-Field Scanning: Contemporary Standards and Methods. In 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON) (29-30). https://doi.org/10.1109/GEMCCON57842.2023.10078194

• Presentation Conference Type: Edited Proceedings
• Conference Name: 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
• Start Date: Jan 19, 2023
• End Date: Jan 20, 2023
• Acceptance Date: Dec 1, 2022
• Online Publication Date: Mar 28, 2023
• Publication Date: Mar 28, 2023
• Deposit Date: Apr 12, 2023
• Publicly Available Date: Apr 12, 2023
• Pages: 29-30
• Series Title: Global Electromagnetic Compatibility Conference (GEMCCON)
• Book Title: 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
• ISBN: 9798350396942
• DOI: https://doi.org/10.1109/GEMCCON57842.2023.10078194
• Keywords: Technical requirements , Surface reconstruction , Surface waves , Software , Calibration , Noise measurement , Finite wordlength effects, EMC , Near-Field , Far-Field , time domain , frequency domain , standards , compliance
• Public URL: https://nottingham-repository.worktribe.com/output/19454276
• Publisher URL: https://ieeexplore.ieee.org/document/10078194