State of the Art of Near-Field Scanning: Contemporary Standards and Methods

Voskresenskyi, Sviatoslav; Aitbar, Iqra; Ballukja, Erjon; Niewiadomski, Karol; Thomas, David W.P.; Greedy, Steve

doi:10.1109/GEMCCON57842.2023.10078194

State of the Art of Near-Field Scanning: Contemporary Standards and Methods

Voskresenskyi, Sviatoslav; Aitbar, Iqra; Ballukja, Erjon; Niewiadomski, Karol; Thomas, David W.P.; Greedy, Steve

Authors

SVIATOSLAV VOSKRESENSKYI Sviatoslav.Voskresenskyi1@nottingham.ac.uk
Casual PhD RA in EMI Modelling

Miss Iqra Aitbar Iqra.Aitbar1@nottingham.ac.uk
Casual PhD RA in EMI Modelling

Erjon Ballukja

Karol Niewiadomski

David W.P. Thomas

Dr STEVE GREEDY STEVE.GREEDY@NOTTINGHAM.AC.UK
ASSOCIATE PROFESSOR

Abstract

This paper presents a review of a number of techniques used for near-field scanning and detection of electromagnetic radiation sources. It also gives an overview of standards, related to technical requirements for the devices as well as scanning methods. Subsequently, a comparison between Far Field (FF) and Near Field (NF) is given. We present the advantages of NF over FF, and list the common problems for NF scanning, such as calibration, protraction in overall scanning time. Finally, we refer the possible solutions and improvements for scanning setup and software.

Citation

Voskresenskyi, S., Aitbar, I., Ballukja, E., Niewiadomski, K., Thomas, D. W., & Greedy, S. (2023, January). State of the Art of Near-Field Scanning: Contemporary Standards and Methods. Presented at 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON), Nusa Dua, Indonesia

Presentation Conference Type	Edited Proceedings
Conference Name	2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
Start Date	Jan 19, 2023
End Date	Jan 20, 2023
Acceptance Date	Dec 1, 2022
Online Publication Date	Mar 28, 2023
Publication Date	Mar 28, 2023
Deposit Date	Apr 12, 2023
Publicly Available Date	Apr 12, 2023
Pages	29-30
Series Title	Global Electromagnetic Compatibility Conference (GEMCCON)
Book Title	2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
ISBN	9798350396942
DOI	https://doi.org/10.1109/GEMCCON57842.2023.10078194
Keywords	Technical requirements , Surface reconstruction , Surface waves , Software , Calibration , Noise measurement , Finite wordlength effects, EMC , Near-Field , Far-Field , time domain , frequency domain , standards , compliance
Public URL	https://nottingham-repository.worktribe.com/output/19454276
Publisher URL	https://ieeexplore.ieee.org/document/10078194